Aumand, Matthieu, Amiard, Guillaume, He, Ran, Ren, Zhifeng, White, Ken W., Thilly, Ludovic (2018) Multi-scale study of the deformation mechanisms of thermoelectric p-type half-Heusler Hf0.44Zr0.44Ti0.12CoSb0.8Sn0.2. Journal of Applied Physics, 124 (17). 175104pp. doi:10.1063/1.5045591
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Multi-scale study of the deformation mechanisms of thermoelectric p-type half-Heusler Hf0.44Zr0.44Ti0.12CoSb0.8Sn0.2 | ||
Journal | Journal of Applied Physics | ||
Authors | Aumand, Matthieu | Author | |
Amiard, Guillaume | Author | ||
He, Ran | Author | ||
Ren, Zhifeng | Author | ||
White, Ken W. | Author | ||
Thilly, Ludovic | Author | ||
Year | 2018 (November 7) | Volume | 124 |
Issue | 17 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.5045591Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5210023 | Long-form Identifier | mindat:1:5:5210023:3 |
GUID | 0 | ||
Full Reference | Aumand, Matthieu, Amiard, Guillaume, He, Ran, Ren, Zhifeng, White, Ken W., Thilly, Ludovic (2018) Multi-scale study of the deformation mechanisms of thermoelectric p-type half-Heusler Hf0.44Zr0.44Ti0.12CoSb0.8Sn0.2. Journal of Applied Physics, 124 (17). 175104pp. doi:10.1063/1.5045591 | ||
Plain Text | Aumand, Matthieu, Amiard, Guillaume, He, Ran, Ren, Zhifeng, White, Ken W., Thilly, Ludovic (2018) Multi-scale study of the deformation mechanisms of thermoelectric p-type half-Heusler Hf0.44Zr0.44Ti0.12CoSb0.8Sn0.2. Journal of Applied Physics, 124 (17). 175104pp. doi:10.1063/1.5045591 | ||
In | (2018, November) Journal of Applied Physics Vol. 124 (17) AIP Publishing |
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