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Liang, S. B., Ke, C. B., Wei, C., Zhou, M. B., Zhang, X. P. (2018) Phase field modeling of grain boundary migration and preferential grain growth driven by electric current stressing. Journal of Applied Physics, 124 (17). 175109pp. doi:10.1063/1.5045637

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Reference TypeJournal (article/letter/editorial)
TitlePhase field modeling of grain boundary migration and preferential grain growth driven by electric current stressing
JournalJournal of Applied Physics
AuthorsLiang, S. B.Author
Ke, C. B.Author
Wei, C.Author
Zhou, M. B.Author
Zhang, X. P.Author
Year2018 (November 7)Volume124
Issue17
PublisherAIP Publishing
DOIdoi:10.1063/1.5045637Search in ResearchGate
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Mindat Ref. ID5210024Long-form Identifiermindat:1:5:5210024:2
GUID0
Full ReferenceLiang, S. B., Ke, C. B., Wei, C., Zhou, M. B., Zhang, X. P. (2018) Phase field modeling of grain boundary migration and preferential grain growth driven by electric current stressing. Journal of Applied Physics, 124 (17). 175109pp. doi:10.1063/1.5045637
Plain TextLiang, S. B., Ke, C. B., Wei, C., Zhou, M. B., Zhang, X. P. (2018) Phase field modeling of grain boundary migration and preferential grain growth driven by electric current stressing. Journal of Applied Physics, 124 (17). 175109pp. doi:10.1063/1.5045637
In(2018, November) Journal of Applied Physics Vol. 124 (17) AIP Publishing

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