Dorwling-Carter, Livie, Aramesh, Morteza, Forró, Csaba, Tiefenauer, Raphael F., Shorubalko, Ivan, Vörös, János, Zambelli, Tomaso (2018) Simultaneous scanning ion conductance and atomic force microscopy with a nanopore: Effect of the aperture edge on the ion current images. Journal of Applied Physics, 124 (17). 174902pp. doi:10.1063/1.5053879
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Simultaneous scanning ion conductance and atomic force microscopy with a nanopore: Effect of the aperture edge on the ion current images | ||
Journal | Journal of Applied Physics | ||
Authors | Dorwling-Carter, Livie | Author | |
Aramesh, Morteza | Author | ||
Forró, Csaba | Author | ||
Tiefenauer, Raphael F. | Author | ||
Shorubalko, Ivan | Author | ||
Vörös, János | Author | ||
Zambelli, Tomaso | Author | ||
Year | 2018 (November 7) | Volume | 124 |
Issue | 17 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.5053879Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5210046 | Long-form Identifier | mindat:1:5:5210046:4 |
GUID | 0 | ||
Full Reference | Dorwling-Carter, Livie, Aramesh, Morteza, Forró, Csaba, Tiefenauer, Raphael F., Shorubalko, Ivan, Vörös, János, Zambelli, Tomaso (2018) Simultaneous scanning ion conductance and atomic force microscopy with a nanopore: Effect of the aperture edge on the ion current images. Journal of Applied Physics, 124 (17). 174902pp. doi:10.1063/1.5053879 | ||
Plain Text | Dorwling-Carter, Livie, Aramesh, Morteza, Forró, Csaba, Tiefenauer, Raphael F., Shorubalko, Ivan, Vörös, János, Zambelli, Tomaso (2018) Simultaneous scanning ion conductance and atomic force microscopy with a nanopore: Effect of the aperture edge on the ion current images. Journal of Applied Physics, 124 (17). 174902pp. doi:10.1063/1.5053879 | ||
In | (2018, November) Journal of Applied Physics Vol. 124 (17) AIP Publishing |
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