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Kim, Ji Hee, Srolovitz, David J., Cha, Pil-Ryung, Yoon, Jong-Kyu (2018) Erratum: “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]. Journal of Applied Physics, 124 (17). 179901pp. doi:10.1063/1.5064756

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Reference TypeJournal (article/letter/editorial)
TitleErratum: “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]
JournalJournal of Applied Physics
AuthorsKim, Ji HeeAuthor
Srolovitz, David J.Author
Cha, Pil-RyungAuthor
Yoon, Jong-KyuAuthor
Year2018 (November 7)Volume124
Issue17
PublisherAIP Publishing
DOIdoi:10.1063/1.5064756Search in ResearchGate
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Mindat Ref. ID5210051Long-form Identifiermindat:1:5:5210051:6
GUID0
Full ReferenceKim, Ji Hee, Srolovitz, David J., Cha, Pil-Ryung, Yoon, Jong-Kyu (2018) Erratum: “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]. Journal of Applied Physics, 124 (17). 179901pp. doi:10.1063/1.5064756
Plain TextKim, Ji Hee, Srolovitz, David J., Cha, Pil-Ryung, Yoon, Jong-Kyu (2018) Erratum: “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]. Journal of Applied Physics, 124 (17). 179901pp. doi:10.1063/1.5064756
In(2018, November) Journal of Applied Physics Vol. 124 (17) AIP Publishing

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Kim, Ji Hee, Srolovitz, David J., Cha, Pil-Ryung, Yoon, Jong-Kyu (2006) Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches. Journal of Applied Physics, 100 (5). 54502pp. doi:10.1063/1.2336488
Kim, Ji-Hee, Cha, Pil-Ryung, Yeon, Dong-Hee, Yoon, Jong-Kyu (2003) A phase field model for electromigration-induced surface evolution. Metals and Materials International, 9. 279-286 doi:10.1007/bf03027047
Cha, Pil-Ryung, Yeon, Dong-Hee, Yoon, Jong-Kyu (2005) Phase-field model for multicomponent alloy solidification. Journal of Crystal Growth, 274 (1). 281-293 doi:10.1016/j.jcrysgro.2004.10.002
Kim, Jin You, Yeon, Dong Hee, Cha, Pil Ryung, Yoon, Jong Kyu (2005) Study for Step Instabilities Induced by ES Barrier. Materials Science Forum, 475. 3181-3184 doi:10.4028/www.scientific.net/msf.475-479.3181
Hong, Ki-Ha, Yoon, Jong-Kyu, Cha, Pil-Ryung (2006) Influence of epitaxial strain on the terrace and inter-layer diffusions in metal epitaxy. Applied Surface Science, 253. 2776-2784 doi:10.1016/j.apsusc.2006.05.056
Duc Dai, Mai, Eom, Kilho, Kim, Chang-Wan (2012) Erratum: “Nanomechanical mass detection using nonlinear oscillations” [Appl. Phys. Lett. 95, 203104 (2009)]. Applied Physics Letters, 100 (17). 179901pp. doi:10.1063/1.4704660
Olszewski, Zbigniew, Houlihan, Ruth, O’Mahony, Conor, Duane, Russell (2012) Erratum: “Addendum: ‘A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches’ [Appl. Phys. Lett. 93, 094101 (2008)]” [Appl. Phys. Lett. 100, 029903 (2012)]. Applied Physics Letters, 100 (6). 69903pp. doi:10.1063/1.3684271
Khan, S. A., Hassan, Sunia (2017) Erratum: “Effects of electron exchange-correlation potential on electrostatic oscillations in single-walled carbon nanotubes” [J. Appl. Phys. 115, 204304 (2014)]. Journal of Applied Physics, 121 (17). 179901pp. doi:10.1063/1.4983071
Yeon, Dong -Hee, Cha, Pil -Ryung, Chung, Sang -Ik, Yoon, Jong -Kyu (2003) Phase field model for the dynamics of steps and islands on crystal surfaces. Metals and Materials International, 9. 67-76 doi:10.1007/bf03027233
Park, Jae Hyo, Kim, Hyung Yoon, Seok, Ki Hwan, Kiaee, Zohreh, Lee, Sol Kyu, Joo, Seung Ki (2017) Retraction: “Multibit ferroelectric field-effect transistor with epitaxial-like Pb(Zr,Ti)O3” [J. Appl. Phys. 119, 124108 (2016)]. Journal of Applied Physics, 122 (17). 179901pp. doi:10.1063/1.5010777
Song, Jun, Srolovitz, David J. (2008) Mechanism for material transfer in asperity contact. Journal of Applied Physics, 104 (12). 124312pp. doi:10.1063/1.3043582
 
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