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Long, Daniel, Creange, Nicole, Moballegh, Ali, Dickey, Elizabeth C. (2019) Electromigration-induced leakage current enhancement and its anisotropy in single crystal TiO 2. Journal of Applied Physics, 125 (18). 184101pp. doi:10.1063/1.5090402

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Reference TypeJournal (article/letter/editorial)
TitleElectromigration-induced leakage current enhancement and its anisotropy in single crystal TiO 2
JournalJournal of Applied Physics
AuthorsLong, DanielAuthor
Creange, NicoleAuthor
Moballegh, AliAuthor
Dickey, Elizabeth C.Author
Year2019 (May 14)Volume125
Issue18
PublisherAIP Publishing
DOIdoi:10.1063/1.5090402Search in ResearchGate
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Mindat Ref. ID5211051Long-form Identifiermindat:1:5:5211051:3
GUID0
Full ReferenceLong, Daniel, Creange, Nicole, Moballegh, Ali, Dickey, Elizabeth C. (2019) Electromigration-induced leakage current enhancement and its anisotropy in single crystal TiO 2. Journal of Applied Physics, 125 (18). 184101pp. doi:10.1063/1.5090402
Plain TextLong, Daniel, Creange, Nicole, Moballegh, Ali, Dickey, Elizabeth C. (2019) Electromigration-induced leakage current enhancement and its anisotropy in single crystal TiO 2. Journal of Applied Physics, 125 (18). 184101pp. doi:10.1063/1.5090402
In(2019, May) Journal of Applied Physics Vol. 125 (18) AIP Publishing

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