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Dinh, L. N., Stanford, J. A., Saw, C. K., Nelson, A. J., Gollott, R., Haschke, J. M., Allen, P. G., Gardner, C., Hrousis, C., Siekhaus, W. J., McLean, W. (2019) Spectroscopic ellipsometry extraction of optical constants for materials from oxide covered samples: Application to the plutonium/oxides system. Journal of Applied Physics, 125 (18). 183102pp. doi:10.1063/1.5092129

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Reference TypeJournal (article/letter/editorial)
TitleSpectroscopic ellipsometry extraction of optical constants for materials from oxide covered samples: Application to the plutonium/oxides system
JournalJournal of Applied Physics
AuthorsDinh, L. N.Author
Stanford, J. A.Author
Saw, C. K.Author
Nelson, A. J.Author
Gollott, R.Author
Haschke, J. M.Author
Allen, P. G.Author
Gardner, C.Author
Hrousis, C.Author
Siekhaus, W. J.Author
McLean, W.Author
Year2019 (May 14)Volume125
Issue18
PublisherAIP Publishing
DOIdoi:10.1063/1.5092129Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5211058Long-form Identifiermindat:1:5:5211058:6
GUID0
Full ReferenceDinh, L. N., Stanford, J. A., Saw, C. K., Nelson, A. J., Gollott, R., Haschke, J. M., Allen, P. G., Gardner, C., Hrousis, C., Siekhaus, W. J., McLean, W. (2019) Spectroscopic ellipsometry extraction of optical constants for materials from oxide covered samples: Application to the plutonium/oxides system. Journal of Applied Physics, 125 (18). 183102pp. doi:10.1063/1.5092129
Plain TextDinh, L. N., Stanford, J. A., Saw, C. K., Nelson, A. J., Gollott, R., Haschke, J. M., Allen, P. G., Gardner, C., Hrousis, C., Siekhaus, W. J., McLean, W. (2019) Spectroscopic ellipsometry extraction of optical constants for materials from oxide covered samples: Application to the plutonium/oxides system. Journal of Applied Physics, 125 (18). 183102pp. doi:10.1063/1.5092129
In(2019, May) Journal of Applied Physics Vol. 125 (18) AIP Publishing

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Dinh, L. N., Hayes, S., Saw, C. K., McLean, W., Balooch, M., Reimer, J. A. (1999) GaAs nanostructures and films deposited by a Cu-vapor laser. Applied Physics Letters, 75 (15). 2208-2210 doi:10.1063/1.124966
Dinh, L.N., Haschke, J.M., Saw, C.K., Allen, P.G., McLean, W. (2011) Pu2O3 and the plutonium hydriding process. Journal of Nuclear Materials, 408 (2). 171-175 doi:10.1016/j.jnucmat.2010.11.026
Dinh, L.N., McCall, S.K., Saw, C.K., Haschke, J.M., Allen, P.G., McLean, W. (2014) The plutonium–hydrogen reaction: SEM characterization of product morphology. Journal of Nuclear Materials, 451 (1). 143-146 doi:10.1016/j.jnucmat.2014.03.058
Washington, P. L., Ong, H. C., Dai, J. Y., Chang, R. P. H. (1998) Determination of the optical constants of zinc oxide thin films by spectroscopic ellipsometry. Applied Physics Letters, 72 (25). 3261-3263 doi:10.1063/1.121617
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Weber, J. W., Calado, V. E., van de Sanden, M. C. M. (2010) Optical constants of graphene measured by spectroscopic ellipsometry. Applied Physics Letters, 97 (9). 91904pp. doi:10.1063/1.3475393
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Herzinger, C. M., Yao, H., Snyder, P. G., Celii, F. G., Kao, Y.‐C., Johs, B., Woollam, J. A. (1995) Determination of AlAs optical constants by variable angle spectroscopic ellipsometry and a multisample analysis. Journal of Applied Physics, 77 (9). 4677-4687 doi:10.1063/1.359435
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