de Magalhães, C M S, dos Santos, L A P, Souza, D do N, Maia, A F (2010) Effect on the insulation material of a MOSFET device submitted to a standard diagnostic radiation beam. Journal of Physics: Conference Series, 249. 12032pp. doi:10.1088/1742-6596/249/1/012032
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Effect on the insulation material of a MOSFET device submitted to a standard diagnostic radiation beam | ||
Journal | Journal of Physics: Conference Series | ||
Authors | de Magalhães, C M S | Author | |
dos Santos, L A P | Author | ||
Souza, D do N | Author | ||
Maia, A F | Author | ||
Year | 2010 (November 1) | Volume | 249 |
Publisher | IOP Publishing | ||
DOI | doi:10.1088/1742-6596/249/1/012032Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5231851 | Long-form Identifier | mindat:1:5:5231851:3 |
GUID | 0 | ||
Full Reference | de Magalhães, C M S, dos Santos, L A P, Souza, D do N, Maia, A F (2010) Effect on the insulation material of a MOSFET device submitted to a standard diagnostic radiation beam. Journal of Physics: Conference Series, 249. 12032pp. doi:10.1088/1742-6596/249/1/012032 | ||
Plain Text | de Magalhães, C M S, dos Santos, L A P, Souza, D do N, Maia, A F (2010) Effect on the insulation material of a MOSFET device submitted to a standard diagnostic radiation beam. Journal of Physics: Conference Series, 249. 12032pp. doi:10.1088/1742-6596/249/1/012032 | ||
In | (2010) Journal of Physics: Conference Series Vol. 249. IOP Publishing |
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