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Asano, S, Suzuki, K M, Matsumura, D, Ishii, K, Ina, T, Fujita, M (2018) Reduction and oxidation annealing effects on Cu K-edge XAFS for electron-doped cuprate superconductors. Journal of Physics: Conference Series, 969. 12051pp. doi:10.1088/1742-6596/969/1/012051

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Reference TypeJournal (article/letter/editorial)
TitleReduction and oxidation annealing effects on Cu K-edge XAFS for electron-doped cuprate superconductors
JournalJournal of Physics: Conference Series
AuthorsAsano, SAuthor
Suzuki, K MAuthor
Matsumura, DAuthor
Ishii, KAuthor
Ina, TAuthor
Fujita, MAuthor
Year2018 (March)Volume969
PublisherIOP Publishing
DOIdoi:10.1088/1742-6596/969/1/012051Search in ResearchGate
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Mindat Ref. ID5280312Long-form Identifiermindat:1:5:5280312:7
GUID0
Full ReferenceAsano, S, Suzuki, K M, Matsumura, D, Ishii, K, Ina, T, Fujita, M (2018) Reduction and oxidation annealing effects on Cu K-edge XAFS for electron-doped cuprate superconductors. Journal of Physics: Conference Series, 969. 12051pp. doi:10.1088/1742-6596/969/1/012051
Plain TextAsano, S, Suzuki, K M, Matsumura, D, Ishii, K, Ina, T, Fujita, M (2018) Reduction and oxidation annealing effects on Cu K-edge XAFS for electron-doped cuprate superconductors. Journal of Physics: Conference Series, 969. 12051pp. doi:10.1088/1742-6596/969/1/012051
In(2018) Journal of Physics: Conference Series Vol. 969. IOP Publishing

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