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Yoshida, J, Ando, H, Kokubo, N (2018) Flux-flow instability in 2H-NbSe2superconducting thin crystals stamped on SiO2/Si substrates. Journal of Physics: Conference Series, 969. 12073pp. doi:10.1088/1742-6596/969/1/012073

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Reference TypeJournal (article/letter/editorial)
TitleFlux-flow instability in 2H-NbSe2superconducting thin crystals stamped on SiO2/Si substrates
JournalJournal of Physics: Conference Series
AuthorsYoshida, JAuthor
Ando, HAuthor
Kokubo, NAuthor
Year2018 (March)Volume969
PublisherIOP Publishing
DOIdoi:10.1088/1742-6596/969/1/012073Search in ResearchGate
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Mindat Ref. ID5280334Long-form Identifiermindat:1:5:5280334:9
GUID0
Full ReferenceYoshida, J, Ando, H, Kokubo, N (2018) Flux-flow instability in 2H-NbSe2superconducting thin crystals stamped on SiO2/Si substrates. Journal of Physics: Conference Series, 969. 12073pp. doi:10.1088/1742-6596/969/1/012073
Plain TextYoshida, J, Ando, H, Kokubo, N (2018) Flux-flow instability in 2H-NbSe2superconducting thin crystals stamped on SiO2/Si substrates. Journal of Physics: Conference Series, 969. 12073pp. doi:10.1088/1742-6596/969/1/012073
In(2018) Journal of Physics: Conference Series Vol. 969. IOP Publishing

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