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Jark, W., Eichert, D. (2015) Comment on “Grazing incidence X-ray fluorescence of periodic structures – a comparison between X-ray standing waves and geometrical optics calculations” by F. Reinhardt, S. H. Nowak, B. Beckhoff, J-C. Dousse and M. Schoengen, JAAS, 2014, 29, 1778. Journal of Analytical Atomic Spectrometry, 30 (12). 2548-2550 doi:10.1039/c5ja00040h

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Reference TypeJournal (article/letter/editorial)
TitleComment on “Grazing incidence X-ray fluorescence of periodic structures – a comparison between X-ray standing waves and geometrical optics calculations” by F. Reinhardt, S. H. Nowak, B. Beckhoff, J-C. Dousse and M. Schoengen, JAAS, 2014, 29, 1778
JournalJournal of Analytical Atomic Spectrometry
AuthorsJark, W.Author
Eichert, D.Author
Year2015Volume30
Issue12
PublisherRoyal Society of Chemistry (RSC)
DOIdoi:10.1039/c5ja00040hSearch in ResearchGate
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Mindat Ref. ID5342877Long-form Identifiermindat:1:5:5342877:4
GUID0
Full ReferenceJark, W., Eichert, D. (2015) Comment on “Grazing incidence X-ray fluorescence of periodic structures – a comparison between X-ray standing waves and geometrical optics calculations” by F. Reinhardt, S. H. Nowak, B. Beckhoff, J-C. Dousse and M. Schoengen, JAAS, 2014, 29, 1778. Journal of Analytical Atomic Spectrometry, 30 (12). 2548-2550 doi:10.1039/c5ja00040h
Plain TextJark, W., Eichert, D. (2015) Comment on “Grazing incidence X-ray fluorescence of periodic structures – a comparison between X-ray standing waves and geometrical optics calculations” by F. Reinhardt, S. H. Nowak, B. Beckhoff, J-C. Dousse and M. Schoengen, JAAS, 2014, 29, 1778. Journal of Analytical Atomic Spectrometry, 30 (12). 2548-2550 doi:10.1039/c5ja00040h
In(2015) Journal of Analytical Atomic Spectrometry Vol. 30 (12) Royal Society of Chemistry (RSC)

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Reinhardt, Falk, Nowak, Stanisław H., Beckhoff, Burkhard, Dousse, Jean-Claude, Schoengen, Max (2014) Grazing incidence X-ray fluorescence of periodic structures – a comparison between X-ray standing waves and geometrical optics calculations. J. Anal. At. Spectrom., 29 (10). 1778-1784 doi:10.1039/c4ja00164h
Nowak, Stanisław H., Beckhoff, Burkhard, Reinhardt, Falk, Dousse, Jean-Claude (2015) Reply to the Comment on “Grazing incidence X-ray fluorescence of periodic structures – a comparison between X-ray standing waves and geometrical optics calculations”. Journal of Analytical Atomic Spectrometry, 30 (12). 2551-2553 doi:10.1039/c5ja00244c
Nowak, Stanisław H., Reinhardt, Falk, Beckhoff, Burkhard, Dousse, Jean-Claude, Szlachetko, Jakub (2013) Geometrical optics modelling of grazing incidence X-ray fluorescence of nanoscaled objects. Journal of Analytical Atomic Spectrometry, 28 (5). 689pp. doi:10.1039/c3ja30338a
Hönicke, P., Kayser, Y., Beckhoff, B., Müller, M., Dousse, J.-Cl., Hoszowska, J., Nowak, S. H. (2012) Characterization of ultra-shallow aluminum implants in silicon by grazing incidence and grazing emission X-ray fluorescence spectroscopy. Journal of Analytical Atomic Spectrometry, 27 (9). 1432pp. doi:10.1039/c2ja10385k
Kayser, Yves, Hönicke, Philipp, Banaś, Dariusz, Dousse, Jean-Claude, Hoszowska, Joanna, Jagodziński, Paweł, Kubala-Kukuś, Aldona, Nowak, Stanisław H., Pajek, Marek (2015) Depth profiling of low energy ion implantations in Si and Ge by means of micro-focused grazing emission X-ray fluorescence and grazing incidence X-ray fluorescence. Journal of Analytical Atomic Spectrometry, 30 (5). 1086-1099 doi:10.1039/c4ja00461b
Nowak, S.H., Banaś, D., Błchucki, W., Cao, W., Dousse, J.-Cl., Hönicke, P., Hoszowska, J., Jabłoński, Ł., Kayser, Y., Kubala-Kukuś, A., Pajek, M., Reinhardt, F., Savu, A.V., Szlachetko, J. (2014) Grazing angle X-ray fluorescence from periodic structures on silicon and silica surfaces. Spectrochimica Acta Part B: Atomic Spectroscopy, 98. 65-75 doi:10.1016/j.sab.2014.03.015
Pollakowski, Beatrix, Beckhoff, Burkhard (2015) Nondestructive Speciation Depth Profiling of Complex TiOx Nanolayer Structures by Grazing Incidence X-ray Fluorescence Analysis and Near Edge X-ray Absorption Fine Structure Spectroscopy. Analytical Chemistry, 87 (15). 7705-7711 doi:10.1021/acs.analchem.5b01172
Shcherbina, M A, Chvalun, S N, Ponomarenko, S A, Kovalchuk, M V (2014) Modern approaches to investigation of thin films and monolayers: X-ray reflectivity, grazing-incidence X-ray scattering and X-ray standing waves. Russian Chemical Reviews, 83 (12) 1091-1119 doi:10.1070/rcr4485
Pełka, Jerzy B., Cedola, Alessia, Lagomarsino, Stefano, di Fonzo, Silvia, Jark, Werner, Soullié, Gerard (1999) Application of resonance-enhanced X-ray standing waves to the study of layered structures by grazing-incidence X-ray reflectometry and secondary radiation. Journal of Alloys and Compounds, 286. 313-321 doi:10.1016/s0925-8388(98)01027-5
Pollakowski, Beatrix, Beckhoff, Burkhard, Reinhardt, Falk, Braun, Stefan, Gawlitza, Peter (2008) Speciation of deeply buriedTiOxnanolayers with grazing-incidence x-ray fluorescence combined with a near-edge x-ray absorption fine-structure investigation. Physical Review B, 77 (23) doi:10.1103/physrevb.77.235408
Nolot, E., Caby, B., Gassilloud, R., Veillerot, M., Eichert, D. (2018) X-ray reflectometry and grazing-incidence X-ray fluorescence characterization of innovative electrodes for tantalum-based resistive random access memories. Spectrochimica Acta Part B: Atomic Spectroscopy, 149. 71-75 doi:10.1016/j.sab.2018.07.017
 
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