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Taracheva, E. Yu., Filatova, E. O., André, J.-M. (2007) Polarization and orientational effect in the x-ray reflection and absorption spectra of sulfur in hexagonal CdS. X-Ray Spectrometry, 36 (5). 305-309 doi:10.1002/xrs.972

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Reference TypeJournal (article/letter/editorial)
TitlePolarization and orientational effect in the x-ray reflection and absorption spectra of sulfur in hexagonal CdS
JournalX-Ray Spectrometry
AuthorsTaracheva, E. Yu.Author
Filatova, E. O.Author
André, J.-M.Author
Year2007 (September)Volume36
Issue5
PublisherWiley
DOIdoi:10.1002/xrs.972Search in ResearchGate
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Mindat Ref. ID5384166Long-form Identifiermindat:1:5:5384166:5
GUID0
Full ReferenceTaracheva, E. Yu., Filatova, E. O., André, J.-M. (2007) Polarization and orientational effect in the x-ray reflection and absorption spectra of sulfur in hexagonal CdS. X-Ray Spectrometry, 36 (5). 305-309 doi:10.1002/xrs.972
Plain TextTaracheva, E. Yu., Filatova, E. O., André, J.-M. (2007) Polarization and orientational effect in the x-ray reflection and absorption spectra of sulfur in hexagonal CdS. X-Ray Spectrometry, 36 (5). 305-309 doi:10.1002/xrs.972
In(2007, September) X-Ray Spectrometry Vol. 36 (5) Wiley

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Filatova, E. O., Taracheva, E. Yu., Sokolov, A. A., Bukin, S. V., Shulakov, A. S., Jonnard, P., André, J.-M., Drozd, V. E. (2006) Ultrasoft x-ray reflection and emission spectroscopic analysis of Al2O3/Si structure synthesized by the atomic layer deposition method. X-Ray Spectrometry, 35 (6). 359-364 doi:10.1002/xrs.919
Filatova, E O, André, J-M, Taracheva, E Yu, Tvaladze, A J, Kraizman, V L, Novakovich, A A, Vedrinskii, R V (2004) Experimental and theoretical studies of orientational dependence of x-ray reflectivity in vicinity of S K-edge in hexagonal CdS crystal. Journal of Physics: Condensed Matter, 16 (25). 4597-4606 doi:10.1088/0953-8984/16/25/017
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Fernández, J. E. (1993) Polarization effects in x-ray photon diffusion. X-Ray Spectrometry, 22 (4). 286-292 doi:10.1002/xrs.1300220421
Arčon, Iztok, Benčan, Andreja, Kodre, Alojz, Kosec, Marija (2007) X-ray absorption spectroscopy analysis of Ru in La2RuO5. X-Ray Spectrometry, 36 (5). 301-304 doi:10.1002/xrs.946
Short, M. A., Bonner, E. J. (1989) X-ray bremsstrahlung spectra. X-Ray Spectrometry, 18 (4). 183-186 doi:10.1002/xrs.1300180410
André, J.-M., Filatova, E. O., Renault, O., Damlencourt, J.-F., Martin, F., Jonnard, P. (2006) Characterization of a HfO2/SiO2/Si system by X-ray reflection and X-ray emission spectroscopies. Surface and Interface Analysis, 38 (4). 777-780 doi:10.1002/sia.2133
André, J.-M., Jonnard, P., Benbalagh, R. (2007) Multilayer interference mirrors as components for soft x-ray WDS monochromators and tunable radiation sources. X-Ray Spectrometry, 36 (2). 62-65 doi:10.1002/xrs.933
André, J.-M., Jonnard, P., Michaelsen, C., Wiesmann, J., Bridou, F., Ravet, M.-F., Jérome, A., Delmotte, F., Filatova, E. O. (2005) La/B4C small period multilayer interferential mirror for the analysis of boron. X-Ray Spectrometry, 34 (3). 203-206 doi:10.1002/xrs.793
 
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