Puranik, S.G., King, E.V. (1988) Study of ion beam induced mixing during sputter depth profiling of thin films by LEIS. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 34 (1). 102-112 doi:10.1016/0168-583x(88)90371-0
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Study of ion beam induced mixing during sputter depth profiling of thin films by LEIS | ||
Journal | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | ||
Authors | Puranik, S.G. | Author | |
King, E.V. | Author | ||
Year | 1988 (July) | Volume | 34 |
Issue | 1 | ||
Publisher | Elsevier BV | ||
DOI | doi:10.1016/0168-583x(88)90371-0Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5591331 | Long-form Identifier | mindat:1:5:5591331:9 |
GUID | 0 | ||
Full Reference | Puranik, S.G., King, E.V. (1988) Study of ion beam induced mixing during sputter depth profiling of thin films by LEIS. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 34 (1). 102-112 doi:10.1016/0168-583x(88)90371-0 | ||
Plain Text | Puranik, S.G., King, E.V. (1988) Study of ion beam induced mixing during sputter depth profiling of thin films by LEIS. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 34 (1). 102-112 doi:10.1016/0168-583x(88)90371-0 | ||
In | (1988, July) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 34 (1) Elsevier BV |
See Also
These are possibly similar items as determined by title/reference text matching only.
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() |