Toevs, James W. (1971) Total yield measurements in 16O(α, γ)20Ne and 28Si(α, γ)32S. Nuclear Physics A, 172. 589-602 doi:10.1016/0375-9474(71)90046-7
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Total yield measurements in 16O(α, γ)20Ne and 28Si(α, γ)32S | ||
| Journal | Nuclear Physics A | ||
| Authors | Toevs, James W. | Author | |
| Year | 1971 (September) | Volume | 172 |
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/0375-9474(71)90046-7Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 5592172 | Long-form Identifier | mindat:1:5:5592172:5 |
| GUID | 0 | ||
| Full Reference | Toevs, James W. (1971) Total yield measurements in 16O(α, γ)20Ne and 28Si(α, γ)32S. Nuclear Physics A, 172. 589-602 doi:10.1016/0375-9474(71)90046-7 | ||
| Plain Text | Toevs, James W. (1971) Total yield measurements in 16O(α, γ)20Ne and 28Si(α, γ)32S. Nuclear Physics A, 172. 589-602 doi:10.1016/0375-9474(71)90046-7 | ||
| In | (1971) Nuclear Physics A Vol. 172. Elsevier BV | ||
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