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Whitlow, Harry J., Ren, Minqin, Chen, Xiao, Osipowicz, Thomas, van Kan, Jeroen A., Watt, Frank (2013) Angular spreading measurements using MeV ion microscopes. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 306. 311-313 doi:10.1016/j.nimb.2012.11.035

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Reference TypeJournal (article/letter/editorial)
TitleAngular spreading measurements using MeV ion microscopes
JournalNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
AuthorsWhitlow, Harry J.Author
Ren, MinqinAuthor
Chen, XiaoAuthor
Osipowicz, ThomasAuthor
van Kan, Jeroen A.Author
Watt, FrankAuthor
Year2013 (July)Volume306
PublisherElsevier BV
DOIdoi:10.1016/j.nimb.2012.11.035Search in ResearchGate
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Mindat Ref. ID5647534Long-form Identifiermindat:1:5:5647534:8
GUID0
Full ReferenceWhitlow, Harry J., Ren, Minqin, Chen, Xiao, Osipowicz, Thomas, van Kan, Jeroen A., Watt, Frank (2013) Angular spreading measurements using MeV ion microscopes. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 306. 311-313 doi:10.1016/j.nimb.2012.11.035
Plain TextWhitlow, Harry J., Ren, Minqin, Chen, Xiao, Osipowicz, Thomas, van Kan, Jeroen A., Watt, Frank (2013) Angular spreading measurements using MeV ion microscopes. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 306. 311-313 doi:10.1016/j.nimb.2012.11.035
In(2013) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 306. Elsevier BV

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