O’Connell, J.H., Skuratov, V.A., Sohatsky, A.S., Neethling, J.H. (2014) 1.2 MeV/amu Xe ion induced damage recovery in SiC. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 326. 337-340 doi:10.1016/j.nimb.2013.09.034
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | 1.2 MeV/amu Xe ion induced damage recovery in SiC | ||
Journal | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | ||
Authors | O’Connell, J.H. | Author | |
Skuratov, V.A. | Author | ||
Sohatsky, A.S. | Author | ||
Neethling, J.H. | Author | ||
Year | 2014 (May) | Volume | 326 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.nimb.2013.09.034Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5649390 | Long-form Identifier | mindat:1:5:5649390:0 |
GUID | 0 | ||
Full Reference | O’Connell, J.H., Skuratov, V.A., Sohatsky, A.S., Neethling, J.H. (2014) 1.2 MeV/amu Xe ion induced damage recovery in SiC. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 326. 337-340 doi:10.1016/j.nimb.2013.09.034 | ||
Plain Text | O’Connell, J.H., Skuratov, V.A., Sohatsky, A.S., Neethling, J.H. (2014) 1.2 MeV/amu Xe ion induced damage recovery in SiC. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 326. 337-340 doi:10.1016/j.nimb.2013.09.034 | ||
In | (2014) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 326. Elsevier BV |
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