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Heirwegh, Christopher M., Campbell, John L., Czamanske, Gerald K. (2016) Refinement of major- and minor-element PIXE analysis of rocks and minerals. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 366. 40-50 doi:10.1016/j.nimb.2015.10.018

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Reference TypeJournal (article/letter/editorial)
TitleRefinement of major- and minor-element PIXE analysis of rocks and minerals
JournalNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
AuthorsHeirwegh, Christopher M.Author
Campbell, John L.Author
Czamanske, Gerald K.Author
Year2016 (January)Volume366
PublisherElsevier BV
DOIdoi:10.1016/j.nimb.2015.10.018Search in ResearchGate
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Mindat Ref. ID5652488Long-form Identifiermindat:1:5:5652488:4
GUID0
Full ReferenceHeirwegh, Christopher M., Campbell, John L., Czamanske, Gerald K. (2016) Refinement of major- and minor-element PIXE analysis of rocks and minerals. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 366. 40-50 doi:10.1016/j.nimb.2015.10.018
Plain TextHeirwegh, Christopher M., Campbell, John L., Czamanske, Gerald K. (2016) Refinement of major- and minor-element PIXE analysis of rocks and minerals. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 366. 40-50 doi:10.1016/j.nimb.2015.10.018
In(2016) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 366. Elsevier BV

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Campbell, John L., Czamanske, Gerald K., MacDonald, Leonard, Teesdale, William J. (1997) Quantitative analysis of major elements in silicate minerals and glasses by micro-PIXE. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 130 (1). 608-616 doi:10.1016/s0168-583x(97)00258-9
Campbell, John L., Ganly, Brianna, Heirwegh, Christopher M., Maxwell, John A. (2018) Separation of detector non-linearity issues and multiple ionization satellites in alpha-particle PIXE. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 414. 38-44 doi:10.1016/j.nimb.2017.10.001
Campbell, John L., Heirwegh, Christopher M., Ganly, Brianna (2016) Non-linearity issues and multiple ionization satellites in the PIXE portion of spectra from the Mars alpha particle X-ray spectrometer. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 383. 143-151 doi:10.1016/j.nimb.2016.07.004
Heirwegh, Christopher M., Petric, Marko, Fazinić, Stjepko, Kavčič, Matjaž, Mihalić, Iva Božičević, Schneider, Jordan, Zamboni, Ivana, Campbell, John L. (2018) Multiple ionization X-ray satellites of magnesium, aluminum and silicon in alpha particle PIXE. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 428. 9-16 doi:10.1016/j.nimb.2018.05.005
Campbell, J.L., Cureatz, D.J.T., Flannigan, E.L., Heirwegh, C.M., Maxwell, J.A., Russell, J.L., Taylor, S.M. (2021) The Guelph PIXE Software Package V. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 499. 77-88 doi:10.1016/j.nimb.2021.05.004
Nejedly, Zdenek, Campbell, John L., Gama, Sophie (2004) An Excel utility for the rapid characterization of ā€œfunny filtersā€ in PIXE analysis. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 219. 136-139 doi:10.1016/j.nimb.2004.01.041
Hlinka, Vasil, Oksuz, Ibrahim, Downing, R. Gregory (2025) Neutron depth profiling extended with PIXE element analysis. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 563. doi:10.1016/j.nimb.2025.165672
Heirwegh, Christopher M., Petric, Marko, Fazinić, Stjepko, Kavčič, Matjaž, Mihalić, Iva Božičević, Schneider, Jordan, Zamboni, Ivana, Campbell, John L. (2022) Corrigendum to ā€œMultiple ionization X-ray satellites of magnesium, aluminum and silicon in alpha particle PIXEā€ [Nucl. Inst. Methods Phys. Res., B 428C (2018) 9ā€“16]. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 526. 60-61 doi:10.1016/j.nimb.2022.06.014
Annett, S.W., Flannigan, E.L., Campbell, J.L. (2024) Comparison of analogue and digital silicon drift detectors in PIXE analysis. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 547. 165209 doi:10.1016/j.nimb.2023.165209
Lebon, M., Pichon, L., Beck, L. (2018) Enhanced identification of trace element fingerprint of prehistoric pigments by PIXE mapping. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 417. 91-95 doi:10.1016/j.nimb.2017.10.010
(2015) Conference photos ā€“ PIXE 2015. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 363. 4-6 doi:10.1016/j.nimb.2015.10.056
 
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