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Dolgonos, Alex, Mason, Thomas O., Poeppelmeier, Kenneth R. (2016) Direct optical band gap measurement in polycrystalline semiconductors: A critical look at the Tauc method. Journal of Solid State Chemistry, 240. 43-48 doi:10.1016/j.jssc.2016.05.010

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Reference TypeJournal (article/letter/editorial)
TitleDirect optical band gap measurement in polycrystalline semiconductors: A critical look at the Tauc method
JournalJournal of Solid State Chemistry
AuthorsDolgonos, AlexAuthor
Mason, Thomas O.Author
Poeppelmeier, Kenneth R.Author
Year2016 (August)Volume240
PublisherElsevier BV
DOIdoi:10.1016/j.jssc.2016.05.010Search in ResearchGate
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Mindat Ref. ID593151Long-form Identifiermindat:1:5:593151:8
GUID0
Full ReferenceDolgonos, Alex, Mason, Thomas O., Poeppelmeier, Kenneth R. (2016) Direct optical band gap measurement in polycrystalline semiconductors: A critical look at the Tauc method. Journal of Solid State Chemistry, 240. 43-48 doi:10.1016/j.jssc.2016.05.010
Plain TextDolgonos, Alex, Mason, Thomas O., Poeppelmeier, Kenneth R. (2016) Direct optical band gap measurement in polycrystalline semiconductors: A critical look at the Tauc method. Journal of Solid State Chemistry, 240. 43-48 doi:10.1016/j.jssc.2016.05.010
In(2016) Journal of Solid State Chemistry Vol. 240. Elsevier BV

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