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Zhang, Ji-Tao, Wu, Xue-Jian, Li, Yan (2012) Mixed polarization in determining the film thickness of a silicon sphere by spectroscopic ellipsometry. Chinese Physics B, 21. 10701pp. doi:10.1088/1674-1056/21/1/010701

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Reference TypeJournal (article/letter/editorial)
TitleMixed polarization in determining the film thickness of a silicon sphere by spectroscopic ellipsometry
JournalChinese Physics B
AuthorsZhang, Ji-TaoAuthor
Wu, Xue-JianAuthor
Li, YanAuthor
Year2012 (January)Volume21
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/21/1/010701Search in ResearchGate
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Mindat Ref. ID6001803Long-form Identifiermindat:1:5:6001803:4
GUID0
Full ReferenceZhang, Ji-Tao, Wu, Xue-Jian, Li, Yan (2012) Mixed polarization in determining the film thickness of a silicon sphere by spectroscopic ellipsometry. Chinese Physics B, 21. 10701pp. doi:10.1088/1674-1056/21/1/010701
Plain TextZhang, Ji-Tao, Wu, Xue-Jian, Li, Yan (2012) Mixed polarization in determining the film thickness of a silicon sphere by spectroscopic ellipsometry. Chinese Physics B, 21. 10701pp. doi:10.1088/1674-1056/21/1/010701
In(n.d.) Chinese Physics B Vol. 21. IOP Publishing

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