Fang, Mei-Hua, Wei, Zhi-Yong, Zhang, Zi-Xia, Zhu, Li, Fu, Yu, Shi, Miao, Li, Guang-Wu, Guo, Gang (2013) Micro-track structure analysis for 100 MeV Si ions in CR-39 by using atomic force microscopy. Chinese Physics B, 22. 116105pp. doi:10.1088/1674-1056/22/11/116105
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Micro-track structure analysis for 100 MeV Si ions in CR-39 by using atomic force microscopy | ||
Journal | Chinese Physics B | ||
Authors | Fang, Mei-Hua | Author | |
Wei, Zhi-Yong | Author | ||
Zhang, Zi-Xia | Author | ||
Zhu, Li | Author | ||
Fu, Yu | Author | ||
Shi, Miao | Author | ||
Li, Guang-Wu | Author | ||
Guo, Gang | Author | ||
Year | 2013 (November) | Volume | 22 |
Publisher | IOP Publishing | ||
DOI | doi:10.1088/1674-1056/22/11/116105Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 6003207 | Long-form Identifier | mindat:1:5:6003207:0 |
GUID | 0 | ||
Full Reference | Fang, Mei-Hua, Wei, Zhi-Yong, Zhang, Zi-Xia, Zhu, Li, Fu, Yu, Shi, Miao, Li, Guang-Wu, Guo, Gang (2013) Micro-track structure analysis for 100 MeV Si ions in CR-39 by using atomic force microscopy. Chinese Physics B, 22. 116105pp. doi:10.1088/1674-1056/22/11/116105 | ||
Plain Text | Fang, Mei-Hua, Wei, Zhi-Yong, Zhang, Zi-Xia, Zhu, Li, Fu, Yu, Shi, Miao, Li, Guang-Wu, Guo, Gang (2013) Micro-track structure analysis for 100 MeV Si ions in CR-39 by using atomic force microscopy. Chinese Physics B, 22. 116105pp. doi:10.1088/1674-1056/22/11/116105 | ||
In | (n.d.) Chinese Physics B Vol. 22. IOP Publishing |
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