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Emin, Muhemmed, Abduleziz, Ablat, Wu, Rui, Wang, Jia-Ou, Qian, Hai-Jie, Kurash, Ibrahim (2013) In situ electronic structural study of VO 2 thin film across the metal—insulator transition. Chinese Physics B, 22. 127103pp. doi:10.1088/1674-1056/22/12/127103

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Reference TypeJournal (article/letter/editorial)
TitleIn situ electronic structural study of VO 2 thin film across the metal—insulator transition
JournalChinese Physics B
AuthorsEmin, MuhemmedAuthor
Abduleziz, AblatAuthor
Wu, RuiAuthor
Wang, Jia-OuAuthor
Qian, Hai-JieAuthor
Kurash, IbrahimAuthor
Year2013 (December)Volume22
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/22/12/127103Search in ResearchGate
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Mindat Ref. ID6003315Long-form Identifiermindat:1:5:6003315:8
GUID0
Full ReferenceEmin, Muhemmed, Abduleziz, Ablat, Wu, Rui, Wang, Jia-Ou, Qian, Hai-Jie, Kurash, Ibrahim (2013) In situ electronic structural study of VO 2 thin film across the metal—insulator transition. Chinese Physics B, 22. 127103pp. doi:10.1088/1674-1056/22/12/127103
Plain TextEmin, Muhemmed, Abduleziz, Ablat, Wu, Rui, Wang, Jia-Ou, Qian, Hai-Jie, Kurash, Ibrahim (2013) In situ electronic structural study of VO 2 thin film across the metal—insulator transition. Chinese Physics B, 22. 127103pp. doi:10.1088/1674-1056/22/12/127103
In(n.d.) Chinese Physics B Vol. 22. IOP Publishing

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