Gao, Bo, Liu, Gang, Wang, Li-Xin, Han, Zheng-Sheng, Song, Li-Mei, Zhang, Yan-Fei, Teng, Rui, Wu, Hai-Zhou (2013) The effects of radiation damage on power VDMOS devices with composite SiO2—Si3N4 films. Chinese Physics B, 22. 36103pp. doi:10.1088/1674-1056/22/3/036103
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | The effects of radiation damage on power VDMOS devices with composite SiO2—Si3N4 films | ||
| Journal | Chinese Physics B | ||
| Authors | Gao, Bo | Author | |
| Liu, Gang | Author | ||
| Wang, Li-Xin | Author | ||
| Han, Zheng-Sheng | Author | ||
| Song, Li-Mei | Author | ||
| Zhang, Yan-Fei | Author | ||
| Teng, Rui | Author | ||
| Wu, Hai-Zhou | Author | ||
| Year | 2013 (March) | Volume | 22 |
| Publisher | IOP Publishing | ||
| DOI | doi:10.1088/1674-1056/22/3/036103Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 6003513 | Long-form Identifier | mindat:1:5:6003513:8 |
| GUID | 0 | ||
| Full Reference | Gao, Bo, Liu, Gang, Wang, Li-Xin, Han, Zheng-Sheng, Song, Li-Mei, Zhang, Yan-Fei, Teng, Rui, Wu, Hai-Zhou (2013) The effects of radiation damage on power VDMOS devices with composite SiO2—Si3N4 films. Chinese Physics B, 22. 36103pp. doi:10.1088/1674-1056/22/3/036103 | ||
| Plain Text | Gao, Bo, Liu, Gang, Wang, Li-Xin, Han, Zheng-Sheng, Song, Li-Mei, Zhang, Yan-Fei, Teng, Rui, Wu, Hai-Zhou (2013) The effects of radiation damage on power VDMOS devices with composite SiO2—Si3N4 films. Chinese Physics B, 22. 36103pp. doi:10.1088/1674-1056/22/3/036103 | ||
| In | (n.d.) Chinese Physics B Vol. 22. IOP Publishing | ||
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