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Geng, Chao, Liu, Jie, Xi, Kai, Zhang, Zhan-Gang, Gu, Song, Hou, Ming-Dong, Sun, You-Mei, Duan, Jing-Lai, Yao, Hui-Jun, Mo, Dan (2013) Monte Carlo evaluation of spatial multiple-bit upset sensitivity to oblique incidence. Chinese Physics B, 22. 59501pp. doi:10.1088/1674-1056/22/5/059501

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Reference TypeJournal (article/letter/editorial)
TitleMonte Carlo evaluation of spatial multiple-bit upset sensitivity to oblique incidence
JournalChinese Physics B
AuthorsGeng, ChaoAuthor
Liu, JieAuthor
Xi, KaiAuthor
Zhang, Zhan-GangAuthor
Gu, SongAuthor
Hou, Ming-DongAuthor
Sun, You-MeiAuthor
Duan, Jing-LaiAuthor
Yao, Hui-JunAuthor
Mo, DanAuthor
Year2013 (May)Volume22
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/22/5/059501Search in ResearchGate
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Mindat Ref. ID6003756Long-form Identifiermindat:1:5:6003756:1
GUID0
Full ReferenceGeng, Chao, Liu, Jie, Xi, Kai, Zhang, Zhan-Gang, Gu, Song, Hou, Ming-Dong, Sun, You-Mei, Duan, Jing-Lai, Yao, Hui-Jun, Mo, Dan (2013) Monte Carlo evaluation of spatial multiple-bit upset sensitivity to oblique incidence. Chinese Physics B, 22. 59501pp. doi:10.1088/1674-1056/22/5/059501
Plain TextGeng, Chao, Liu, Jie, Xi, Kai, Zhang, Zhan-Gang, Gu, Song, Hou, Ming-Dong, Sun, You-Mei, Duan, Jing-Lai, Yao, Hui-Jun, Mo, Dan (2013) Monte Carlo evaluation of spatial multiple-bit upset sensitivity to oblique incidence. Chinese Physics B, 22. 59501pp. doi:10.1088/1674-1056/22/5/059501
In(n.d.) Chinese Physics B Vol. 22. IOP Publishing

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