Tian, Xiao-Bo, Xu, Hui (2014) Characteristics of titanium oxide memristor with coexistence of dopant drift and a tunnel barrier. Chinese Physics B, 23. 68401pp. doi:10.1088/1674-1056/23/6/068401
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Characteristics of titanium oxide memristor with coexistence of dopant drift and a tunnel barrier | ||
Journal | Chinese Physics B | ||
Authors | Tian, Xiao-Bo | Author | |
Xu, Hui | Author | ||
Year | 2014 (June) | Volume | 23 |
Publisher | IOP Publishing | ||
DOI | doi:10.1088/1674-1056/23/6/068401Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 6005118 | Long-form Identifier | mindat:1:5:6005118:1 |
GUID | 0 | ||
Full Reference | Tian, Xiao-Bo, Xu, Hui (2014) Characteristics of titanium oxide memristor with coexistence of dopant drift and a tunnel barrier. Chinese Physics B, 23. 68401pp. doi:10.1088/1674-1056/23/6/068401 | ||
Plain Text | Tian, Xiao-Bo, Xu, Hui (2014) Characteristics of titanium oxide memristor with coexistence of dopant drift and a tunnel barrier. Chinese Physics B, 23. 68401pp. doi:10.1088/1674-1056/23/6/068401 | ||
In | (n.d.) Chinese Physics B Vol. 23. IOP Publishing |
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