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Lu, Han-Han, Xu, Jing-Ping, Liu, Lu, Lai, Pui-To, Tang, Wing-Man (2016) Equivalent distributed capacitance model of oxide traps on frequency dispersion of C – V curve for MOS capacitors. Chinese Physics B, 25. 118502pp. doi:10.1088/1674-1056/25/11/118502

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Reference TypeJournal (article/letter/editorial)
TitleEquivalent distributed capacitance model of oxide traps on frequency dispersion of C – V curve for MOS capacitors
JournalChinese Physics B
AuthorsLu, Han-HanAuthor
Xu, Jing-PingAuthor
Liu, LuAuthor
Lai, Pui-ToAuthor
Tang, Wing-ManAuthor
Year2016 (November)Volume25
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/25/11/118502Search in ResearchGate
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Mindat Ref. ID6006925Long-form Identifiermindat:1:5:6006925:0
GUID0
Full ReferenceLu, Han-Han, Xu, Jing-Ping, Liu, Lu, Lai, Pui-To, Tang, Wing-Man (2016) Equivalent distributed capacitance model of oxide traps on frequency dispersion of C – V curve for MOS capacitors. Chinese Physics B, 25. 118502pp. doi:10.1088/1674-1056/25/11/118502
Plain TextLu, Han-Han, Xu, Jing-Ping, Liu, Lu, Lai, Pui-To, Tang, Wing-Man (2016) Equivalent distributed capacitance model of oxide traps on frequency dispersion of C – V curve for MOS capacitors. Chinese Physics B, 25. 118502pp. doi:10.1088/1674-1056/25/11/118502
In(n.d.) Chinese Physics B Vol. 25. IOP Publishing

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