Li, Yong-Liang, Xu, Qiu-Xia, Wang, Wen-Wu (2018) Key technologies for dual high- k and dual metal gate integration. Chinese Physics B, 27. 97306pp. doi:10.1088/1674-1056/27/9/097306
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Key technologies for dual high- k and dual metal gate integration | ||
Journal | Chinese Physics B | ||
Authors | Li, Yong-Liang | Author | |
Xu, Qiu-Xia | Author | ||
Wang, Wen-Wu | Author | ||
Year | 2018 (September) | Volume | 27 |
Publisher | IOP Publishing | ||
DOI | doi:10.1088/1674-1056/27/9/097306Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 6009709 | Long-form Identifier | mindat:1:5:6009709:5 |
GUID | 0 | ||
Full Reference | Li, Yong-Liang, Xu, Qiu-Xia, Wang, Wen-Wu (2018) Key technologies for dual high- k and dual metal gate integration. Chinese Physics B, 27. 97306pp. doi:10.1088/1674-1056/27/9/097306 | ||
Plain Text | Li, Yong-Liang, Xu, Qiu-Xia, Wang, Wen-Wu (2018) Key technologies for dual high- k and dual metal gate integration. Chinese Physics B, 27. 97306pp. doi:10.1088/1674-1056/27/9/097306 | ||
In | (n.d.) Chinese Physics B Vol. 27. IOP Publishing |
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