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Lai, C.-W., Chiu, M.-H. (2007) Surface profile measurement using laser-scanning angle deviation microscopy. Applied Physics A, 89. 403-406 doi:10.1007/s00339-007-4135-1

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Reference TypeJournal (article/letter/editorial)
TitleSurface profile measurement using laser-scanning angle deviation microscopy
JournalApplied Physics A
AuthorsLai, C.-W.Author
Chiu, M.-H.Author
Year2007 (August 25)Volume89
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/s00339-007-4135-1Search in ResearchGate
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Mindat Ref. ID6013014Long-form Identifiermindat:1:5:6013014:1
GUID0
Full ReferenceLai, C.-W., Chiu, M.-H. (2007) Surface profile measurement using laser-scanning angle deviation microscopy. Applied Physics A, 89. 403-406 doi:10.1007/s00339-007-4135-1
Plain TextLai, C.-W., Chiu, M.-H. (2007) Surface profile measurement using laser-scanning angle deviation microscopy. Applied Physics A, 89. 403-406 doi:10.1007/s00339-007-4135-1
In(2007) Applied Physics A Vol. 89. Springer Science and Business Media LLC

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Chiu, Ming-Hung, Shih, Bo-Yuan, Lai, Chih-Wen (2007) Laser-scanning angle deviation microscopy. Applied Physics Letters, 90 (2). 21111pp. doi:10.1063/1.2430027
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Tang, W.T., Chung, E., Kim, Y., So, P.T.C., Sheppard, C.J.R. (2007) Effects of using a metal layer in total internal reflection fluorescence microscopy. Applied Physics A, 89. 333-335 doi:10.1007/s00339-007-4119-1
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