Reference Type | Journal (article/letter/editorial) |
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Title | Measurement of femtosecond laser-induced damage and ablation thresholds in dielectrics |
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Journal | Applied Physics A |
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Authors | Sanner, N. | Author |
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Utéza, O. | Author |
Bussiere, B. | Author |
Coustillier, G. | Author |
Leray, A. | Author |
Itina, T. | Author |
Sentis, M. | Author |
Year | 2009 (March) | Volume | 94 |
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Publisher | Springer Science and Business Media LLC |
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DOI | doi:10.1007/s00339-009-5077-6Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 6013816 | Long-form Identifier | mindat:1:5:6013816:1 |
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GUID | 0 |
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Full Reference | Sanner, N., Utéza, O., Bussiere, B., Coustillier, G., Leray, A., Itina, T., Sentis, M. (2009) Measurement of femtosecond laser-induced damage and ablation thresholds in dielectrics. Applied Physics A, 94. 889-897 doi:10.1007/s00339-009-5077-6 |
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Plain Text | Sanner, N., Utéza, O., Bussiere, B., Coustillier, G., Leray, A., Itina, T., Sentis, M. (2009) Measurement of femtosecond laser-induced damage and ablation thresholds in dielectrics. Applied Physics A, 94. 889-897 doi:10.1007/s00339-009-5077-6 |
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In | (2009) Applied Physics A Vol. 94. Springer Science and Business Media LLC |
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