Zhang, Yanwen, Sachan, Ritesh, Pakarinen, Olli H., Chisholm, Matthew F., Liu, Peng, Xue, Haizhou, Weber, William J. (2015) Ionization-induced annealing of pre-existing defects in silicon carbide. Nature Communications, 6. doi:10.1038/ncomms9049
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Ionization-induced annealing of pre-existing defects in silicon carbide | ||
| Journal | Nature Communications | ||
| Authors | Zhang, Yanwen | Author | |
| Sachan, Ritesh | Author | ||
| Pakarinen, Olli H. | Author | ||
| Chisholm, Matthew F. | Author | ||
| Liu, Peng | Author | ||
| Xue, Haizhou | Author | ||
| Weber, William J. | Author | ||
| Year | 2015 (November) | Volume | 6 |
| Publisher | Springer Science and Business Media LLC | ||
| DOI | doi:10.1038/ncomms9049Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 6064997 | Long-form Identifier | mindat:1:5:6064997:7 |
| GUID | 0 | ||
| Full Reference | Zhang, Yanwen, Sachan, Ritesh, Pakarinen, Olli H., Chisholm, Matthew F., Liu, Peng, Xue, Haizhou, Weber, William J. (2015) Ionization-induced annealing of pre-existing defects in silicon carbide. Nature Communications, 6. doi:10.1038/ncomms9049 | ||
| Plain Text | Zhang, Yanwen, Sachan, Ritesh, Pakarinen, Olli H., Chisholm, Matthew F., Liu, Peng, Xue, Haizhou, Weber, William J. (2015) Ionization-induced annealing of pre-existing defects in silicon carbide. Nature Communications, 6. doi:10.1038/ncomms9049 | ||
| In | (2015) Nature Communications Vol. 6. Springer Science and Business Media LLC | ||
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