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Seine, G., Coratger, R., Carladous, A., Ajustron, F., Pechou, R., Beauvillain, J. (2000) Imaging using tip–surface distance variations vs. voltage in scanning tunneling microscopy. Surface Science, 465 (3). 219-226 doi:10.1016/s0039-6028(00)00676-2

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Reference TypeJournal (article/letter/editorial)
TitleImaging using tip–surface distance variations vs. voltage in scanning tunneling microscopy
JournalSurface Science
AuthorsSeine, G.Author
Coratger, R.Author
Carladous, A.Author
Ajustron, F.Author
Pechou, R.Author
Beauvillain, J.Author
Year2000 (October)Volume465
Issue3
PublisherElsevier BV
DOIdoi:10.1016/s0039-6028(00)00676-2Search in ResearchGate
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Mindat Ref. ID6475108Long-form Identifiermindat:1:5:6475108:5
GUID0
Full ReferenceSeine, G., Coratger, R., Carladous, A., Ajustron, F., Pechou, R., Beauvillain, J. (2000) Imaging using tip–surface distance variations vs. voltage in scanning tunneling microscopy. Surface Science, 465 (3). 219-226 doi:10.1016/s0039-6028(00)00676-2
Plain TextSeine, G., Coratger, R., Carladous, A., Ajustron, F., Pechou, R., Beauvillain, J. (2000) Imaging using tip–surface distance variations vs. voltage in scanning tunneling microscopy. Surface Science, 465 (3). 219-226 doi:10.1016/s0039-6028(00)00676-2
In(2000, October) Surface Science Vol. 465 (3) Elsevier BV

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Seine, G., Coratger, R., Carladous, A., Ajustron, F., Pechou, R., Beauvillain, J. (1999) Tip-to-surface distance variations vs voltage in scanning tunneling microscopy. Physical Review B, 60 (15) 11045-11050 doi:10.1103/physrevb.60.11045
Seine, G., Coratger, R., Carladous, A., Ajustron, F., Pechou, R., Beauvillain, J. (2002) Reply to “Comment on ‘Tip-to-surface distance variations vs voltage in scanning tunneling microscopy’ ”. Physical Review B, 65 (7) doi:10.1103/physrevb.65.077402
Chahboun, A., Coratger, R., Pechou, R., Ajustron, F., Beauvillain, J. (2000) Hot hole transport through Au/n-Si(100) studied by reverse ballistic electron emission microscopy and spectroscopy. Surface Science, 462 (1). 61-67 doi:10.1016/s0039-6028(00)00537-9
Carladous, A., Coratger, R., Seine, G., Ajustron, F., Beauvillain, J. (1998) Photon emission excited in paraffin-passivated GaAs surfaces by scanning tunneling microscopy. Journal of Applied Physics, 84 (2). 1085-1089 doi:10.1063/1.368107
Carladous, A., Coratger, R., Ajustron, F., Seine, G., Péchou, R., Beauvillain, J. (2002) Light emission from spectral analysis ofAu/MoS2nanocontacts stimulated by scanning tunneling microscopy. Physical Review B, 66 (4) doi:10.1103/physrevb.66.045401
Pechou, R, Coratger, R, Ajustron, F, Beauvillain, J (1998) Control of light emission from an STM and surface modifications. Surface Science, 418 (1). 1-7 doi:10.1016/s0039-6028(98)00619-0
Coratger, R., Claverie, A., Ajustron, F., Beauvillain, J. (1990) Scanning tunneling microscopy of defects induced by carbon bombardment on graphite surfaces. Surface Science, 227 (1). 7-14 doi:10.1016/0039-6028(90)90385-l
Maurel, C., Coratger, R., Ajustron, F., Seine, G., Péchou, R., Beauvillain, J. (2003) Effect of multiple tips on light emission induced by STM from gold nanostructures. Surface Science, 529 (3). 359-364 doi:10.1016/s0039-6028(03)00270-x
Pechou, R., Coratger, R., Ajustron, F., Beauvillain, J. (1998) Cutoff anomalies in light emitted from the tunneling junction of a scanning tunneling microscope in air. Applied Physics Letters, 72 (6). 671-673 doi:10.1063/1.120841
Péchou, R., Ajustron, F., Seine, G., Coratger, R., Maurel, C., Beauvillain, J. (2004) A hybrid instrument combining electronic and photonic tunnelling for surface analysis. Applied Surface Science, 225. 332-338 doi:10.1016/j.apsusc.2003.10.023
Maurel, C., Ajustron, F., Péchou, R., Seine, G., Coratger, R. (2006) Electrical behavior of the Au/MoS2 interface studied by light emission induced by scanning tunneling microscopy. Surface Science, 600 (2). 442-447 doi:10.1016/j.susc.2005.10.042
 
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