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Fitzgerald, A. G., Henderson, A. E., Hicks, S. E., Moir, P. A., Storey, B. E. (1989) Quantification of amorphous SiC: H films using XPS and AES with three standards. Surface and Interface Analysis, 14 (6). 376-380 doi:10.1002/sia.740140614

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Reference TypeJournal (article/letter/editorial)
TitleQuantification of amorphous SiC: H films using XPS and AES with three standards
JournalSurface and Interface Analysis
AuthorsFitzgerald, A. G.Author
Henderson, A. E.Author
Hicks, S. E.Author
Moir, P. A.Author
Storey, B. E.Author
Year1989 (June)Volume14
Issue6
PublisherWiley
DOIdoi:10.1002/sia.740140614Search in ResearchGate
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Mindat Ref. ID6502240Long-form Identifiermindat:1:5:6502240:3
GUID0
Full ReferenceFitzgerald, A. G., Henderson, A. E., Hicks, S. E., Moir, P. A., Storey, B. E. (1989) Quantification of amorphous SiC: H films using XPS and AES with three standards. Surface and Interface Analysis, 14 (6). 376-380 doi:10.1002/sia.740140614
Plain TextFitzgerald, A. G., Henderson, A. E., Hicks, S. E., Moir, P. A., Storey, B. E. (1989) Quantification of amorphous SiC: H films using XPS and AES with three standards. Surface and Interface Analysis, 14 (6). 376-380 doi:10.1002/sia.740140614
In(1989, June) Surface and Interface Analysis Vol. 14 (6) Wiley

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Moir, P. A., Fitzgerald, A. G., Storey, B. E. (1989) Computer-Aided quantification of AES and XPS spectra. Surface and Interface Analysis, 14 (6). 295-301 doi:10.1002/sia.740140605
Fitzgerald, A. G., Moir, P. A., Storey, B. E. (1992) Application of AQUA and QUAX to matrix corrections in AES and XPS. Surface and Interface Analysis, 19 (1). 200-204 doi:10.1002/sia.740190139
Fitzgerald, A. G., Henderson, A. E., Storey, B. E. (1990) A microbeam analytical study of a-C: H films. Surface and Interface Analysis, 16 (1). 497-503 doi:10.1002/sia.7401601104
Jablonski, Aleksander (1989) Elastic scattering and quantification in AES and XPS. Surface and Interface Analysis, 14 (11). 659-685 doi:10.1002/sia.740141102
Fitzgerald, A. G., Watton, H. L. L., Storey, B. E., Colligon, J. S., Kheyrandish, H. (1994) Computer programs for surface analysis by SIMS and SNMS. Surface and Interface Analysis, 22 (1). 69-74 doi:10.1002/sia.740220118
Bender, H., Portillo, J., Vandervorst, W. (1989) Quantitative AES and XPS investigation of magnetron sputtered TiNx films. Surface and Interface Analysis, 14 (6). 337-346 doi:10.1002/sia.740140610
Grant, J. T. (1989) Methods for quantitative analysis in XPS and AES. Surface and Interface Analysis, 14 (6). 271-283 doi:10.1002/sia.740140602
Contarini, S., Giunta, G., Loreti, S., Nistico, N., Lambers, E., Holloway, P. H. (1994) Interface analysis of ceramic matrix composites by XPS, AES, SEM and XRD. Surface and Interface Analysis, 22 (1). 258-262 doi:10.1002/sia.740220156
Watton, H. L. L., Fitzgerald, A. G., Moir, P. A. (1991) Composition of thin surface layers obtained by X-ray photoelectron spectroscopy. Surface and Interface Analysis, 17 (6). 320-324 doi:10.1002/sia.740170605
Ichimura, S., Bauer, H. E., Seiler, H., Hofmann, S. (1989) Reduction of charging in surface analysis of insulating materials by AES. Surface and Interface Analysis, 14 (5). 250-256 doi:10.1002/sia.740140507
Zanoni, R., Righini, G., Montenero, A., Gnappi, G., Montesperelli, G., Traversa, E., Gusmano, G. (1994) XPS analysis of sol-gel processed doped and undoped TiO2 films for sensors. Surface and Interface Analysis, 22 (1). 376-379 doi:10.1002/sia.740220182
 
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