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Niemi, E., Stolt, L. (1990) Characterization of CuInSe2 thin films by XPS. Surface and Interface Analysis, 15 (7). 422-426 doi:10.1002/sia.740150705

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Reference TypeJournal (article/letter/editorial)
TitleCharacterization of CuInSe2 thin films by XPS
JournalSurface and Interface Analysis
AuthorsNiemi, E.Author
Stolt, L.Author
Year1990 (July)Volume15
Issue7
PublisherWiley
DOIdoi:10.1002/sia.740150705Search in ResearchGate
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Mindat Ref. ID6502616Long-form Identifiermindat:1:5:6502616:2
GUID0
Full ReferenceNiemi, E., Stolt, L. (1990) Characterization of CuInSe2 thin films by XPS. Surface and Interface Analysis, 15 (7). 422-426 doi:10.1002/sia.740150705
Plain TextNiemi, E., Stolt, L. (1990) Characterization of CuInSe2 thin films by XPS. Surface and Interface Analysis, 15 (7). 422-426 doi:10.1002/sia.740150705
In(1990, July) Surface and Interface Analysis Vol. 15 (7) Wiley

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McIntyre, N. S., Johnston, D., Coatsworth, L. L., Brown, J. R. (1986) Reactions on thin films of cobalt-molybdenum oxides: I. characterization of molybdenum and cobalt oxide species by high resolution XPS. Surface and Interface Analysis, 9 (4). 253-254 doi:10.1002/sia.740090415
 
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