| Reference Type | Journal (article/letter/editorial) |
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| Title | Strukturelle Charakterisierung von kolloidalem Platin durch hochauflösende Elektronenmikroskopie und EXAFS-Analyse |
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| Journal | Angewandte Chemie |
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| Authors | Duff, Daniel G. | Author |
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| Edwards, Peter P. | Author |
| Evans, John | Author |
| Gauntlett, J. Trevor | Author |
| Jefferson, David A. | Author |
| Johnson, Brian F. G. | Author |
| Kirkland, Angus I. | Author |
| Smith, David J. | Author |
| Year | 1989 (May) | Volume | 101 |
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| Issue | 5 |
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| Publisher | Wiley |
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| DOI | doi:10.1002/ange.19891010510Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 7288051 | Long-form Identifier | mindat:1:5:7288051:3 |
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|
| GUID | 0 |
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| Full Reference | Duff, Daniel G., Edwards, Peter P., Evans, John, Gauntlett, J. Trevor, Jefferson, David A., Johnson, Brian F. G., Kirkland, Angus I., Smith, David J. (1989) Strukturelle Charakterisierung von kolloidalem Platin durch hochauflösende Elektronenmikroskopie und EXAFS-Analyse. Angewandte Chemie, 101 (5). 610-613 doi:10.1002/ange.19891010510 |
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| Plain Text | Duff, Daniel G., Edwards, Peter P., Evans, John, Gauntlett, J. Trevor, Jefferson, David A., Johnson, Brian F. G., Kirkland, Angus I., Smith, David J. (1989) Strukturelle Charakterisierung von kolloidalem Platin durch hochauflösende Elektronenmikroskopie und EXAFS-Analyse. Angewandte Chemie, 101 (5). 610-613 doi:10.1002/ange.19891010510 |
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| In | (1989, May) Angewandte Chemie Vol. 101 (5) Wiley |
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