Mader, Werner (1994) Scanning Electron Microscopy and X-ray Analysis. Von R. E. Lee. Ellis Horwood, PRT Prentice Hall, Englewood Cliffs, USA, 1993. 464 S., geb. 60.00 $. β ISBN 0-13-813759-5. Angewandte Chemie, 106 (14). 1591-1592 doi:10.1002/ange.19941061438
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Scanning Electron Microscopy and X-ray Analysis. Von R. E. Lee. Ellis Horwood, PRT Prentice Hall, Englewood Cliffs, USA, 1993. 464 S., geb. 60.00 $. β ISBN 0-13-813759-5 | ||
Journal | Angewandte Chemie | ||
Authors | Mader, Werner | Author | |
Year | 1994 (July 14) | Volume | 106 |
Issue | 14 | ||
Publisher | Wiley | ||
DOI | doi:10.1002/ange.19941061438Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 7291010 | Long-form Identifier | mindat:1:5:7291010:6 |
GUID | 0 | ||
Full Reference | Mader, Werner (1994) Scanning Electron Microscopy and X-ray Analysis. Von R. E. Lee. Ellis Horwood, PRT Prentice Hall, Englewood Cliffs, USA, 1993. 464 S., geb. 60.00 $. β ISBN 0-13-813759-5. Angewandte Chemie, 106 (14). 1591-1592 doi:10.1002/ange.19941061438 | ||
Plain Text | Mader, Werner (1994) Scanning Electron Microscopy and X-ray Analysis. Von R. E. Lee. Ellis Horwood, PRT Prentice Hall, Englewood Cliffs, USA, 1993. 464 S., geb. 60.00 $. β ISBN 0-13-813759-5. Angewandte Chemie, 106 (14). 1591-1592 doi:10.1002/ange.19941061438 | ||
In | (1994, July) Angewandte Chemie Vol. 106 (14) Wiley |
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