Reference Type | Journal (article/letter/editorial) |
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Title | Photoexcited Electron Capture by Ionized and Neutral Shallow Impurities in Silicon at Liquid-Helium Temperatures |
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Journal | Physical Review |
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Authors | Loewenstein, M. | Author |
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Honig, A. | Author |
Year | 1966 (April 15) | Volume | 144 |
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Issue | 2 |
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Publisher | American Physical Society (APS) |
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DOI | doi:10.1103/physrev.144.781Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 7492750 | Long-form Identifier | mindat:1:5:7492750:8 |
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GUID | 0 |
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Full Reference | Loewenstein, M., Honig, A. (1966) Photoexcited Electron Capture by Ionized and Neutral Shallow Impurities in Silicon at Liquid-Helium Temperatures. Physical Review, 144 (2). 781-788 doi:10.1103/physrev.144.781 |
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Plain Text | Loewenstein, M., Honig, A. (1966) Photoexcited Electron Capture by Ionized and Neutral Shallow Impurities in Silicon at Liquid-Helium Temperatures. Physical Review, 144 (2). 781-788 doi:10.1103/physrev.144.781 |
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In | (1966, April) Physical Review Vol. 144 (2) American Physical Society (APS) |
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