Goh, Siew Wei, Buckley, Alan N., Lamb, Robert N., Woods, Ronald (2006) The ability of static secondary ion mass spectrometry to discriminate submonolayer from multilayer adsorption of thiol collectors. Minerals Engineering, 19 (6). 571-581 doi:10.1016/j.mineng.2005.09.009
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | The ability of static secondary ion mass spectrometry to discriminate submonolayer from multilayer adsorption of thiol collectors | ||
Journal | Minerals Engineering | ||
Authors | Goh, Siew Wei | Author | |
Buckley, Alan N. | Author | ||
Lamb, Robert N. | Author | ||
Woods, Ronald | Author | ||
Year | 2006 (May) | Volume | 19 |
Issue | 6 | ||
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.mineng.2005.09.009Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 7716505 | Long-form Identifier | mindat:1:5:7716505:7 |
GUID | 0 | ||
Full Reference | Goh, Siew Wei, Buckley, Alan N., Lamb, Robert N., Woods, Ronald (2006) The ability of static secondary ion mass spectrometry to discriminate submonolayer from multilayer adsorption of thiol collectors. Minerals Engineering, 19 (6). 571-581 doi:10.1016/j.mineng.2005.09.009 | ||
Plain Text | Goh, Siew Wei, Buckley, Alan N., Lamb, Robert N., Woods, Ronald (2006) The ability of static secondary ion mass spectrometry to discriminate submonolayer from multilayer adsorption of thiol collectors. Minerals Engineering, 19 (6). 571-581 doi:10.1016/j.mineng.2005.09.009 | ||
In | (2006, May) Minerals Engineering Vol. 19 (6) Elsevier BV |
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