Aoyama, Yoshitaka, Park, Young-Gil, Lee, Chang-Woo, Shindo, Daisuke (2002) Precise Evaluation of Charging Effect on SiO2 Particles by Simulation of Holograms. MATERIALS TRANSACTIONS, 43 (3). 474-477 doi:10.2320/matertrans.43.474
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Precise Evaluation of Charging Effect on SiO2 Particles by Simulation of Holograms | ||
Journal | MATERIALS TRANSACTIONS | ||
Authors | Aoyama, Yoshitaka | Author | |
Park, Young-Gil | Author | ||
Lee, Chang-Woo | Author | ||
Shindo, Daisuke | Author | ||
Year | 2002 | Volume | 43 |
Issue | 3 | ||
Publisher | Japan Institute of Metals | ||
DOI | doi:10.2320/matertrans.43.474Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 7776373 | Long-form Identifier | mindat:1:5:7776373:4 |
GUID | 0 | ||
Full Reference | Aoyama, Yoshitaka, Park, Young-Gil, Lee, Chang-Woo, Shindo, Daisuke (2002) Precise Evaluation of Charging Effect on SiO2 Particles by Simulation of Holograms. MATERIALS TRANSACTIONS, 43 (3). 474-477 doi:10.2320/matertrans.43.474 | ||
Plain Text | Aoyama, Yoshitaka, Park, Young-Gil, Lee, Chang-Woo, Shindo, Daisuke (2002) Precise Evaluation of Charging Effect on SiO2 Particles by Simulation of Holograms. MATERIALS TRANSACTIONS, 43 (3). 474-477 doi:10.2320/matertrans.43.474 | ||
In | (2002) MATERIALS TRANSACTIONS Vol. 43 (3) Japan Institute of Metals |
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