Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Iwamoto, Chihiro, Shen, Xu-Qiang, Okumura, Hajime, Matsuhata, Hirofumi, Ikuhara, Yuuichi (2002) Structure Analysis of GaN Thin Film with Inversion Domains by High Voltage Atomic Resolution Microscopy. MATERIALS TRANSACTIONS, 43 (7). 1542-1546 doi:10.2320/matertrans.43.1542

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleStructure Analysis of GaN Thin Film with Inversion Domains by High Voltage Atomic Resolution Microscopy
JournalMATERIALS TRANSACTIONS
AuthorsIwamoto, ChihiroAuthor
Shen, Xu-QiangAuthor
Okumura, HajimeAuthor
Matsuhata, HirofumiAuthor
Ikuhara, YuuichiAuthor
Year2002Volume43
Issue7
PublisherJapan Institute of Metals
DOIdoi:10.2320/matertrans.43.1542Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID7776567Long-form Identifiermindat:1:5:7776567:1
GUID0
Full ReferenceIwamoto, Chihiro, Shen, Xu-Qiang, Okumura, Hajime, Matsuhata, Hirofumi, Ikuhara, Yuuichi (2002) Structure Analysis of GaN Thin Film with Inversion Domains by High Voltage Atomic Resolution Microscopy. MATERIALS TRANSACTIONS, 43 (7). 1542-1546 doi:10.2320/matertrans.43.1542
Plain TextIwamoto, Chihiro, Shen, Xu-Qiang, Okumura, Hajime, Matsuhata, Hirofumi, Ikuhara, Yuuichi (2002) Structure Analysis of GaN Thin Film with Inversion Domains by High Voltage Atomic Resolution Microscopy. MATERIALS TRANSACTIONS, 43 (7). 1542-1546 doi:10.2320/matertrans.43.1542
In(2002) MATERIALS TRANSACTIONS Vol. 43 (7) Japan Institute of Metals

See Also

These are possibly similar items as determined by title/reference text matching only.

Iwamoto, Chihiro, Satonaka, Shinobu, Yamamoto, Takahisa, Matsuhata, Hirofumi, Ikuhara, Yuuichi (2006) High-resolution Chemical Imaging by Phase Contrast Technique. Materia Japan, 45 (12). 845 doi:10.2320/materia.45.845
Iwamoto, C., Shen, X. Q., Okumura, H., Matuhata, H., Ikuhara, Y. (2001) Nanometric inversion domains in conventional molecular-beam-epitaxy GaN thin films observed by atomic-resolution high-voltage electron microscopy. Applied Physics Letters, 79 (24). 3941-3943 doi:10.1063/1.1427147
Iwamoto, Chihiro, Ikuhara, Yuuichi (2003) Polarity Determination of GaN by Direct Atomic Observation. Materia Japan, 42 (12). 901 doi:10.2320/materia.42.901
Iwamoto, C., Shen, X. Q., Okumura, H., Matsuhata, H., Ikuhara, Y. (2003) Termination mechanism of inversion domains by stacking faults in GaN. Journal of Applied Physics, 93 (6). 3264-3269 doi:10.1063/1.1544427
Matsunaga, Katsuyuki, Iwamoto, Yuji, Ikuhara, Yuichi (2002) Atomic Structure and Diffusion in Amorphous Si-B-C-N by Molecular Dynamics Simulation. MATERIALS TRANSACTIONS, 43 (7). 1506-1511 doi:10.2320/matertrans.43.1506
Akhadejdamrong, Thananan, Mitsuo, Atsushi, Iwamoto, Chihiro, Yamamoto, Takahisa, Ikuhara, Yuichi, Aizawa, Tatsuhiko (2002) Formation of Protection Layer during Oxidation of Al-Implanted TiN Coating. MATERIALS TRANSACTIONS, 43 (6). 1291-1297 doi:10.2320/matertrans.43.1291
Tochigi, Eita, Matsuhata, Hirofumi, Yamaguchi, Hirotaka, Sekiguchi, Takashi, Okumura, Hajime, Ikuhara, Yuichi (2017) Investigation of V-shaped extended defects in a 4H–SiC epitaxial film. Philosophical Magazine, 97 (9). 657-670 doi:10.1080/14786435.2016.1275869
Yamamoto, Takahisa, Oba, Fumiyasu, Ikuhara, Yuichi, Sakuma, Taketo (2002) Current-Voltage Characteristics Across Small Angle Symmetric Tilt Boundaries in Nb-Doped SrTiO3 Bicrystals. MATERIALS TRANSACTIONS, 43 (7). 1537-1541 doi:10.2320/matertrans.43.1537
Nishimura, Hitoshi, Ikuhara, Yuichi, Ota, Ken’ichi, Pezzotti, Giuseppe (2002) Internal Friction Analysis of CaO-Doped Silicon Carbides. MATERIALS TRANSACTIONS, 43 (7). 1552-1556 doi:10.2320/matertrans.43.1552
Yoo, Mina, Lee, Moonho (2002) Characteristics of Thin-Film NTC Infrared Sensors. MATERIALS TRANSACTIONS, 43 (5). 1065-1068 doi:10.2320/matertrans.43.1065
Watanabe, Tsuyoshi, Yoshida, Hidehiro, Ikuhara, Yuichi, Sakuma, Taketo, Muto, Hiroyuki, Sakai, Mototsugu (2002) Grain Boundary Sliding and Atomic Structures in Alumina Bicrystals with [0001] Symmetric Tilt Grain Boundaries. MATERIALS TRANSACTIONS, 43 (7). 1561-1565 doi:10.2320/matertrans.43.1561
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: August 31, 2025 10:44:49
Go to top of page