Yoshida, Tomoko, Sakai, Mikio, Tanabe, Tetsuo (2004) In-Situ Optical Reflection Measurement of a Si(100) Surface under Hydrogen Ion Irradiation. MATERIALS TRANSACTIONS, 45 (7). 2018-2022 doi:10.2320/matertrans.45.2018
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | In-Situ Optical Reflection Measurement of a Si(100) Surface under Hydrogen Ion Irradiation | ||
Journal | MATERIALS TRANSACTIONS | ||
Authors | Yoshida, Tomoko | Author | |
Sakai, Mikio | Author | ||
Tanabe, Tetsuo | Author | ||
Year | 2004 | Volume | 45 |
Issue | 7 | ||
Publisher | Japan Institute of Metals | ||
DOI | doi:10.2320/matertrans.45.2018Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 7777607 | Long-form Identifier | mindat:1:5:7777607:5 |
GUID | 0 | ||
Full Reference | Yoshida, Tomoko, Sakai, Mikio, Tanabe, Tetsuo (2004) In-Situ Optical Reflection Measurement of a Si(100) Surface under Hydrogen Ion Irradiation. MATERIALS TRANSACTIONS, 45 (7). 2018-2022 doi:10.2320/matertrans.45.2018 | ||
Plain Text | Yoshida, Tomoko, Sakai, Mikio, Tanabe, Tetsuo (2004) In-Situ Optical Reflection Measurement of a Si(100) Surface under Hydrogen Ion Irradiation. MATERIALS TRANSACTIONS, 45 (7). 2018-2022 doi:10.2320/matertrans.45.2018 | ||
In | (2004) MATERIALS TRANSACTIONS Vol. 45 (7) Japan Institute of Metals |
See Also
These are possibly similar items as determined by title/reference text matching only.