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Benamara, Z., Tizi, S., Chellali, M., Gruzza, B., Bideux, L., Robert, C. (1997) Electrical characterization of alumina layers deposited by evaporation cell on Si and restructured InP substrates. Synthetic Metals, 90 (3). 229-232 doi:10.1016/s0379-6779(98)80011-8

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Reference TypeJournal (article/letter/editorial)
TitleElectrical characterization of alumina layers deposited by evaporation cell on Si and restructured InP substrates
JournalSynthetic Metals
AuthorsBenamara, Z.Author
Tizi, S.Author
Chellali, M.Author
Gruzza, B.Author
Bideux, L.Author
Robert, C.Author
Year1997 (November)Volume90
Issue3
PublisherElsevier BV
DOIdoi:10.1016/s0379-6779(98)80011-8Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID7793039Long-form Identifiermindat:1:5:7793039:0
GUID0
Full ReferenceBenamara, Z., Tizi, S., Chellali, M., Gruzza, B., Bideux, L., Robert, C. (1997) Electrical characterization of alumina layers deposited by evaporation cell on Si and restructured InP substrates. Synthetic Metals, 90 (3). 229-232 doi:10.1016/s0379-6779(98)80011-8
Plain TextBenamara, Z., Tizi, S., Chellali, M., Gruzza, B., Bideux, L., Robert, C. (1997) Electrical characterization of alumina layers deposited by evaporation cell on Si and restructured InP substrates. Synthetic Metals, 90 (3). 229-232 doi:10.1016/s0379-6779(98)80011-8
In(1997, November) Synthetic Metals Vol. 90 (3) Elsevier BV

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Gruzza, B., Bideux, L., Mangat, P.S., Soukiassian, P. (1997) A study of InP(100) surface passivation by antimony deposition. Synthetic Metals, 90 (3). 223-227 doi:10.1016/s0379-6779(97)03973-8
Bideux, L., Robert, C., Gruzza, B., Matolin, V., Benamara, Z. (1996) Study of Al2O3 condensation on Si(100) and InP(100) substrates. Surface Science, 352. 407-410 doi:10.1016/0039-6028(95)01170-6
Talbi, A., Benamara, Z., Akkal, B., Gruzza, B., Bideux, L., Robert, C., Varenne, C., Chami, N. (2006) Nitridation of InP(100) substrates studied by XPS spectroscopy and electrical analysis. Materials Science and Engineering: A, 437. 254-258 doi:10.1016/j.msea.2006.07.147
Bideux, L., Merle, S., Robert, C., Gruzza, B., Benamarra, Z., Tizi, S., Chellali, M. (1998) Passivation of III-V compounds used for metal-insulator-InP(100) structures. Surface and Interface Analysis, 26 (3). 177-181 doi:10.1002/(sici)1096-9918(199803)26:3<177::aid-sia357>3.0.co;2-o
Benamara, Z, Tizi, S, Chellali, M, Gruzza, B (2000) Experiments in MIS structure based on germanium and improvements of the interfacial properties. Materials Chemistry and Physics, 62. 273-276 doi:10.1016/s0254-0584(98)00260-0
Petit, M, Robert-Goumet, Ch, Bideux, L, Gruzza, B, Benamara, Z, Bouiadjra, N.Bachir, Matolin, V (2004) Auger electronic spectroscopy and electrical characterisation of InP(100) surfaces passivated by N2 plasma. Applied Surface Science, 234. 451-456 doi:10.1016/j.apsusc.2004.05.029
Benamara, Z, Akkal, B, Talbi, A, Gruzza, B, Bideux, L (2002) Electrical parameters evolution of Au/InP(100) and Au/InSb/InP(100) systems with restructuring conditions. Materials Science and Engineering: C, 21. 287-290 doi:10.1016/s0928-4931(02)00082-6
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Flori, M., Gruzza, B., Bideux, L., Monier, G., Robert-Goumet, C., Benamara, Z. (2009) First stages of surface steel nitriding: X-ray photoelectron spectroscopy and electrical measurements. Applied Surface Science, 255. 9206-9210 doi:10.1016/j.apsusc.2009.07.004
Akkal, B, Benamara, Z, Gruzza, B, Bideux, L, Bachir Bouiadjra, N (2002) Analysis and simulation of Au/InSb/InP diode C–V characteristic: modeling and experiments. Materials Science and Engineering: C, 21. 291-296 doi:10.1016/s0928-4931(02)00083-8
Sehil, H., Rahmani, N.M., Pichon, L., Menezla, R., Raoult, F., Benamara, Z. (1997) Characterization of the polysilicon thin film transistors elaborated in high and low temperature processes. Study of the density of traps. Synthetic Metals, 90 (3). 181-185 doi:10.1016/s0379-6779(98)80004-0
 
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