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Crean, G. M., Golanski, A., Oberlin, J. C., Perio, A. (1987) Correlation between the elastic and structural properties of thin‐film tungsten silicide layers from surface acoustic wave analysis. Applied Physics Letters, 51 (20). 1591-1593 doi:10.1063/1.98564

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Reference TypeJournal (article/letter/editorial)
TitleCorrelation between the elastic and structural properties of thin‐film tungsten silicide layers from surface acoustic wave analysis
JournalApplied Physics Letters
AuthorsCrean, G. M.Author
Golanski, A.Author
Oberlin, J. C.Author
Perio, A.Author
Year1987 (November 16)Volume51
Issue20
PublisherAIP Publishing
DOIdoi:10.1063/1.98564Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8481454Long-form Identifiermindat:1:5:8481454:0
GUID0
Full ReferenceCrean, G. M., Golanski, A., Oberlin, J. C., Perio, A. (1987) Correlation between the elastic and structural properties of thin‐film tungsten silicide layers from surface acoustic wave analysis. Applied Physics Letters, 51 (20). 1591-1593 doi:10.1063/1.98564
Plain TextCrean, G. M., Golanski, A., Oberlin, J. C., Perio, A. (1987) Correlation between the elastic and structural properties of thin‐film tungsten silicide layers from surface acoustic wave analysis. Applied Physics Letters, 51 (20). 1591-1593 doi:10.1063/1.98564
In(1987, November) Applied Physics Letters Vol. 51 (20) AIP Publishing

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Vu, D. P., Haond, M., d’Anterroches, C., Oberlin, J. C., Golanski, A., Grob, J. J., Maillet, S. (1988) High quality silicon‐on‐insulator structure formed by oxygen implantation and lamp annealing. Applied Physics Letters, 52 (10). 819-821 doi:10.1063/1.99294
 
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