Reference Type | Journal (article/letter/editorial) |
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Title | Raman scattering measurements of decreased barrier heights in GaAs following surface chemical passivation |
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Journal | Applied Physics Letters |
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Authors | Farrow, L. A. | Author |
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Sandroff, C. J. | Author |
Tamargo, M. C. | Author |
Year | 1987 (December 7) | Volume | 51 |
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Issue | 23 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.98304Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8481664 | Long-form Identifier | mindat:1:5:8481664:5 |
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GUID | 0 |
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Full Reference | Farrow, L. A., Sandroff, C. J., Tamargo, M. C. (1987) Raman scattering measurements of decreased barrier heights in GaAs following surface chemical passivation. Applied Physics Letters, 51 (23). 1931-1933 doi:10.1063/1.98304 |
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Plain Text | Farrow, L. A., Sandroff, C. J., Tamargo, M. C. (1987) Raman scattering measurements of decreased barrier heights in GaAs following surface chemical passivation. Applied Physics Letters, 51 (23). 1931-1933 doi:10.1063/1.98304 |
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In | (1987, December) Applied Physics Letters Vol. 51 (23) AIP Publishing |
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