Reference Type | Journal (article/letter/editorial) |
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Title | Device quality growth and characterization of (110) GaAs grown by molecular beam epitaxy |
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Journal | Applied Physics Letters |
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Authors | Allen, L. T. P. | Author |
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Weber, E. R. | Author |
Washburn, J. | Author |
Pao, Y. C. | Author |
Year | 1987 (August 31) | Volume | 51 |
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Issue | 9 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.98329Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8482317 | Long-form Identifier | mindat:1:5:8482317:7 |
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GUID | 0 |
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Full Reference | Allen, L. T. P., Weber, E. R., Washburn, J., Pao, Y. C. (1987) Device quality growth and characterization of (110) GaAs grown by molecular beam epitaxy. Applied Physics Letters, 51 (9). 670-672 doi:10.1063/1.98329 |
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Plain Text | Allen, L. T. P., Weber, E. R., Washburn, J., Pao, Y. C. (1987) Device quality growth and characterization of (110) GaAs grown by molecular beam epitaxy. Applied Physics Letters, 51 (9). 670-672 doi:10.1063/1.98329 |
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In | (1987, August) Applied Physics Letters Vol. 51 (9) AIP Publishing |
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