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Cookson, David J. (1998) Calculation of Absolute Intensities From X-ray Imaging Plates. Journal of Synchrotron Radiation, 5 (6). 1375-1382 doi:10.1107/s0909049598008334

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Reference TypeJournal (article/letter/editorial)
TitleCalculation of Absolute Intensities From X-ray Imaging Plates
JournalJournal of Synchrotron Radiation
AuthorsCookson, David J.Author
Year1998 (November 1)Volume5
Issue6
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0909049598008334Search in ResearchGate
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Mindat Ref. ID8482806Long-form Identifiermindat:1:5:8482806:6
GUID0
Full ReferenceCookson, David J. (1998) Calculation of Absolute Intensities From X-ray Imaging Plates. Journal of Synchrotron Radiation, 5 (6). 1375-1382 doi:10.1107/s0909049598008334
Plain TextCookson, David J. (1998) Calculation of Absolute Intensities From X-ray Imaging Plates. Journal of Synchrotron Radiation, 5 (6). 1375-1382 doi:10.1107/s0909049598008334
In(1998, November) Journal of Synchrotron Radiation Vol. 5 (6) International Union of Crystallography (IUCr)

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Cookson, David J., Hunter, Brett A., Kennedy, Shane J., Garrett, Richard F. (1998) Multiple-wavelength powder diffraction using imaging plates at the Australian National Beamline. Journal of Synchrotron Radiation, 5 (3). 926-928 doi:10.1107/s0909049597016634
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Hrdý, J. (1998) X-ray Inclined Lens. Journal of Synchrotron Radiation, 5 (4). 1206-1210 doi:10.1107/s0909049598002155
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Pettifer, R. F., Hermes, C. (1985) Absolute energy calibration of X-ray radiation from synchrotron sources. Journal of Applied Crystallography, 18 (6) 404-412 doi:10.1107/s0021889885010627
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Fujikawa, C., Kawachi, T., Ando, K., Yamaguchi, N., Hara, T. (1998) Absolute calibration of a soft X-ray spectrograph for X-ray laser research using white beam. Journal of Synchrotron Radiation, 5 (3). 756-758 doi:10.1107/s0909049597016117
Holmes, K. C., Rosenbaum, G. (1998) How X-ray Diffraction with Synchrotron Radiation Got Started. Journal of Synchrotron Radiation, 5 (3). 147-153 doi:10.1107/s0909049597018578
Amemiya, Y. (1995) Imaging Plates for Use with Synchrotron Radiation. Journal of Synchrotron Radiation, 2 (1). 13-21 doi:10.1107/s0909049594007405
KUDO, Yoshihiro (1998) Synchrotron Radiation. IV. Study on Physical Property by Synchrotron Radiation. 6. Analysis of Lattice Distortion in As-grown Silicon Single Crystals by Plane-wave X-Ray Topography Using Imaging Plates. RADIOISOTOPES, 47. 648-655 doi:10.3769/radioisotopes.47.648
Sutton, David, Hanley, Tracey, Knott, Robert, Cookson, David (2004) Small-angle X-ray scattering on the ChemMatCARS beamline at the Advanced Photon Source: a study of shear-induced crystallization in polypropylene. Journal of Synchrotron Radiation, 11 (6). 505-507 doi:10.1107/s0909049504022873
 
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