Suortti, P., Buslaps, T., Fajardo, P., Honkimäki, V., Kretzschmer, M., Lienert, U., McCarthy, J. E., Renier, M., Shukla, A., Tschentscher, Th., Meinander, T. (1999) Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF. Journal of Synchrotron Radiation, 6 (2). 69-80 doi:10.1107/s0909049599000291
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF | ||
| Journal | Journal of Synchrotron Radiation | ||
| Authors | Suortti, P. | Author | |
| Buslaps, T. | Author | ||
| Fajardo, P. | Author | ||
| Honkimäki, V. | Author | ||
| Kretzschmer, M. | Author | ||
| Lienert, U. | Author | ||
| McCarthy, J. E. | Author | ||
| Renier, M. | Author | ||
| Shukla, A. | Author | ||
| Tschentscher, Th. | Author | ||
| Meinander, T. | Author | ||
| Year | 1999 (March 1) | Volume | 6 |
| Issue | 2 | ||
| Publisher | International Union of Crystallography (IUCr) | ||
| DOI | doi:10.1107/s0909049599000291Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8482854 | Long-form Identifier | mindat:1:5:8482854:3 |
| GUID | 0 | ||
| Full Reference | Suortti, P., Buslaps, T., Fajardo, P., Honkimäki, V., Kretzschmer, M., Lienert, U., McCarthy, J. E., Renier, M., Shukla, A., Tschentscher, Th., Meinander, T. (1999) Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF. Journal of Synchrotron Radiation, 6 (2). 69-80 doi:10.1107/s0909049599000291 | ||
| Plain Text | Suortti, P., Buslaps, T., Fajardo, P., Honkimäki, V., Kretzschmer, M., Lienert, U., McCarthy, J. E., Renier, M., Shukla, A., Tschentscher, Th., Meinander, T. (1999) Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF. Journal of Synchrotron Radiation, 6 (2). 69-80 doi:10.1107/s0909049599000291 | ||
| In | (1999, March) Journal of Synchrotron Radiation Vol. 6 (2) International Union of Crystallography (IUCr) | ||
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