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Lützenkirchen-Hecht, Dirk, Grundmann, Sven, Frahm, Ronald (2001) Piezo-QEXAFS with fluorescence detection: fast time-resolved investigations of dilute specimens. Journal of Synchrotron Radiation, 8 (1). 6-9 doi:10.1107/s0909049500018033

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Reference TypeJournal (article/letter/editorial)
TitlePiezo-QEXAFS with fluorescence detection: fast time-resolved investigations of dilute specimens
JournalJournal of Synchrotron Radiation
AuthorsLützenkirchen-Hecht, DirkAuthor
Grundmann, SvenAuthor
Frahm, RonaldAuthor
Year2001 (January 1)Volume8
Issue1
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0909049500018033Search in ResearchGate
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Mindat Ref. ID8483602Long-form Identifiermindat:1:5:8483602:9
GUID0
Full ReferenceLützenkirchen-Hecht, Dirk, Grundmann, Sven, Frahm, Ronald (2001) Piezo-QEXAFS with fluorescence detection: fast time-resolved investigations of dilute specimens. Journal of Synchrotron Radiation, 8 (1). 6-9 doi:10.1107/s0909049500018033
Plain TextLützenkirchen-Hecht, Dirk, Grundmann, Sven, Frahm, Ronald (2001) Piezo-QEXAFS with fluorescence detection: fast time-resolved investigations of dilute specimens. Journal of Synchrotron Radiation, 8 (1). 6-9 doi:10.1107/s0909049500018033
In(2001, January) Journal of Synchrotron Radiation Vol. 8 (1) International Union of Crystallography (IUCr)

See Also

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Richwin, Matthias, Zaeper, Ralf, Lützenkirchen-Hecht, Dirk, Frahm, Ronald (2001) Piezo-QEXAFS: advances in time-resolved X-ray absorption spectroscopy. Journal of Synchrotron Radiation, 8 (2). 354-356 doi:10.1107/s0909049500017064
Lützenkirchen-Hecht, Dirk, Scotti, Nicole, Jacobs, Herbert, Frahm, Ronald (2001) XAFS investigations of tin nitrides. Journal of Synchrotron Radiation, 8 (2). 698-700 doi:10.1107/s0909049500015119
Lützenkirchen-Hecht, Dirk, Frahm, Ronald (2001) Reflection mode XAFS investigations of reactively sputtered thin films. Journal of Synchrotron Radiation, 8 (2). 478-480 doi:10.1107/s0909049500019701
Stötzel, Jan, Lützenkirchen-Hecht, Dirk, Grunwaldt, Jan-Dierk, Frahm, Ronald (2012) T-REX: new software for advanced QEXAFS data analysis. Journal of Synchrotron Radiation, 19 (6). 920-929 doi:10.1107/s0909049512038599
Stötzel, Jan, Lützenkirchen-Hecht, Dirk, Frahm, Ronald (2011) A new stand-alone QEXAFS data acquisition system forin situstudies. Journal of Synchrotron Radiation, 18 (2). 165-175 doi:10.1107/s0909049510051897
Lützenkirchen-Hecht, D., Frahm, R. (1999) Time-resolved EXAFS investigations of the anodic dissolution of Mo. Journal of Synchrotron Radiation, 6 (3). 591-593 doi:10.1107/s0909049599001946
Lützenkirchen-Hecht, Dirk, Frahm, Ronald (2001) Corrosion of Mo in KOH:  Time Resolved XAFS Investigations. The Journal of Physical Chemistry B, 105 (41). 9988-9993 doi:10.1021/jp003414n
Richwin, Matthias, Zaeper, Ralf, Lützenkirchen-Hecht, Dirk, Frahm, Ronald (2002) Piezo-XAFS–time-resolved x-ray absorption spectroscopy. Review of Scientific Instruments, 73 (3). 1668-1670 doi:10.1063/1.1445832
Grunwaldt, Jan-Dierk, Lützenkirchen-Hecht, Dirk, Richwin, Matthias, Grundmann, Sven, Clausen, Bjerne S., Frahm, Ronald (2001) Piezo X-ray Absorption Spectroscopy for the Investigation of Solid-State Transformations in the Millisecond Range. The Journal of Physical Chemistry B, 105 (22). 5161-5168 doi:10.1021/jp010092u
Bornebusch, H., Clausen, B. S., Steffensen, G., Lützenkirchen-Hecht, D., Frahm, R. (1999) A new approach for QEXAFS data acquisition. Journal of Synchrotron Radiation, 6 (3). 209-211 doi:10.1107/s0909049598017518
Müller, Oliver, Nachtegaal, Maarten, Just, Justus, Lützenkirchen-Hecht, Dirk, Frahm, Ronald (2016) Quick-EXAFS setup at the SuperXAS beamline forin situX-ray absorption spectroscopy with 10 ms time resolution. Journal of Synchrotron Radiation, 23 (1). 260-266 doi:10.1107/s1600577515018007
 
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