Reference Type | Journal (article/letter/editorial) |
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Title | New technique and analysis of accelerated electromigration life testing in multilevel metallizations |
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Journal | Applied Physics Letters |
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Authors | Muray, L. P. | Author |
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Rathbun, L. C. | Author |
Wolf, E. D. | Author |
Year | 1988 (October 10) | Volume | 53 |
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Issue | 15 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.99958Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8484391 | Long-form Identifier | mindat:1:5:8484391:3 |
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GUID | 0 |
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Full Reference | Muray, L. P., Rathbun, L. C., Wolf, E. D. (1988) New technique and analysis of accelerated electromigration life testing in multilevel metallizations. Applied Physics Letters, 53 (15). 1414-1416 doi:10.1063/1.99958 |
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Plain Text | Muray, L. P., Rathbun, L. C., Wolf, E. D. (1988) New technique and analysis of accelerated electromigration life testing in multilevel metallizations. Applied Physics Letters, 53 (15). 1414-1416 doi:10.1063/1.99958 |
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In | (1988, October) Applied Physics Letters Vol. 53 (15) AIP Publishing |
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