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Tuomi, T. (2002) Synchrotron X-ray topography of electronic materials. Journal of Synchrotron Radiation, 9 (3). 174-178 doi:10.1107/s0909049502004284

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Reference TypeJournal (article/letter/editorial)
TitleSynchrotron X-ray topography of electronic materials
JournalJournal of Synchrotron Radiation
AuthorsTuomi, T.Author
Year2002 (May 1)Volume9
Issue3
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0909049502004284Search in ResearchGate
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Mindat Ref. ID8484450Long-form Identifiermindat:1:5:8484450:5
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Full ReferenceTuomi, T. (2002) Synchrotron X-ray topography of electronic materials. Journal of Synchrotron Radiation, 9 (3). 174-178 doi:10.1107/s0909049502004284
Plain TextTuomi, T. (2002) Synchrotron X-ray topography of electronic materials. Journal of Synchrotron Radiation, 9 (3). 174-178 doi:10.1107/s0909049502004284
In(2002, May) Journal of Synchrotron Radiation Vol. 9 (3) International Union of Crystallography (IUCr)

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