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Keil, P., Lützenkirchen-Hecht, D. (2009) Surface-sensitive reflection-mode EXAFS from layered sample systems: the influence of surface and interface roughness. Journal of Synchrotron Radiation, 16 (4). 443-454 doi:10.1107/s0909049509015684

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Reference TypeJournal (article/letter/editorial)
TitleSurface-sensitive reflection-mode EXAFS from layered sample systems: the influence of surface and interface roughness
JournalJournal of Synchrotron Radiation
AuthorsKeil, P.Author
Lützenkirchen-Hecht, D.Author
Year2009 (July 1)Volume16
Issue4
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0909049509015684Search in ResearchGate
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Mindat Ref. ID8486067Long-form Identifiermindat:1:5:8486067:3
GUID0
Full ReferenceKeil, P., Lützenkirchen-Hecht, D. (2009) Surface-sensitive reflection-mode EXAFS from layered sample systems: the influence of surface and interface roughness. Journal of Synchrotron Radiation, 16 (4). 443-454 doi:10.1107/s0909049509015684
Plain TextKeil, P., Lützenkirchen-Hecht, D. (2009) Surface-sensitive reflection-mode EXAFS from layered sample systems: the influence of surface and interface roughness. Journal of Synchrotron Radiation, 16 (4). 443-454 doi:10.1107/s0909049509015684
In(2009, July) Journal of Synchrotron Radiation Vol. 16 (4) International Union of Crystallography (IUCr)

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Lützenkirchen-Hecht, D, Wagemaker, M, Keil, P, van Well, A.A, Frahm, R (2003) Ex situ reflection mode EXAFS at the Ti K-edge of lithium intercalated TiO2 rutile. Surface Science, 538 (1). 10-22 doi:10.1016/s0039-6028(03)00722-2
Lützenkirchen-Hecht, Dirk, Frahm, Ronald (2001) Reflection mode XAFS investigations of reactively sputtered thin films. Journal of Synchrotron Radiation, 8 (2). 478-480 doi:10.1107/s0909049500019701
Lützenkirchen-Hecht, D., Frahm, R. (1999) Time-resolved EXAFS investigations of the anodic dissolution of Mo. Journal of Synchrotron Radiation, 6 (3). 591-593 doi:10.1107/s0909049599001946
Lützenkirchen-Hecht, D., Buchner, P., Uhlenbusch, J., Strehblow, H.-H., Frahm, R. (1999) EXAFS investigation of nanoparticles produced in a thermal plasma process. Journal of Synchrotron Radiation, 6 (3). 722-724 doi:10.1107/s0909049599001156
Ruffoni, M. P. (2009) Differential EXAFS analysis usingDEXA. Journal of Synchrotron Radiation, 16 (4). 591-594 doi:10.1107/s0909049509019839
Lützenkirchen-Hecht, D., Oldag, T., Keil, P., Keller, H.-L., Frahm, R. (2005) A new cell for temperature-dependent X-ray absorption spectroscopy of liquid solutions: application to PbBr2solutions in diethylene glycol. Journal of Synchrotron Radiation, 12 (2). 216-223 doi:10.1107/s0909049504030729
Lützenkirchen-Hecht, Dirk, Wagner, Ralph, Haake, Ulrich, Watenphul, Anke, Frahm, Ronald (2009) The materials science X-ray beamline BL8 at the DELTA storage ring. Journal of Synchrotron Radiation, 16 (2). 264-272 doi:10.1107/s0909049509000508
Belyakov, V. A., Semenov, S. V. (1998) The influence of interface roughness on Mössbauer filtration of synchrotron radiation at an isotope interface. Journal of Synchrotron Radiation, 5 (3). 943-945 doi:10.1107/s0909049598001745
Frahm, R., Wollmann, R., Hammer, H., Lützenkirchen-Hecht, D. (1999) Design and possibilities of the materials science beamline at DELTA. Journal of Synchrotron Radiation, 6 (3). 172-173 doi:10.1107/s090904959801752x
Müller, Oliver, Nachtegaal, Maarten, Just, Justus, Lützenkirchen-Hecht, Dirk, Frahm, Ronald (2016) Quick-EXAFS setup at the SuperXAS beamline forin situX-ray absorption spectroscopy with 10 ms time resolution. Journal of Synchrotron Radiation, 23 (1). 260-266 doi:10.1107/s1600577515018007
Wang, Yun, Xiao, Tiqiao, Xu, Hongjie (2000) Effect of surface roughness on the spatial coherence of X-ray beams from third-generation synchrotron radiation sources. Journal of Synchrotron Radiation, 7 (4). 209-214 doi:10.1107/s0909049500004234
 
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