Reference Type | Journal (article/letter/editorial) |
---|
Title | Measurement of GaAs/InP and InAs/InP heterojunction band offsets by x‐ray photoemission spectroscopy |
---|
Journal | Applied Physics Letters |
---|
Authors | Waldrop, J. R. | Author |
---|
Grant, R. W. | Author |
Kraut, E. A. | Author |
Year | 1989 (May 8) | Volume | 54 |
---|
Issue | 19 |
---|
Publisher | AIP Publishing |
---|
DOI | doi:10.1063/1.101246Search in ResearchGate |
---|
| Generate Citation Formats |
Mindat Ref. ID | 8486524 | Long-form Identifier | mindat:1:5:8486524:3 |
---|
|
GUID | 0 |
---|
Full Reference | Waldrop, J. R., Grant, R. W., Kraut, E. A. (1989) Measurement of GaAs/InP and InAs/InP heterojunction band offsets by x‐ray photoemission spectroscopy. Applied Physics Letters, 54 (19). 1878-1880 doi:10.1063/1.101246 |
---|
Plain Text | Waldrop, J. R., Grant, R. W., Kraut, E. A. (1989) Measurement of GaAs/InP and InAs/InP heterojunction band offsets by x‐ray photoemission spectroscopy. Applied Physics Letters, 54 (19). 1878-1880 doi:10.1063/1.101246 |
---|
In | (1989, May) Applied Physics Letters Vol. 54 (19) AIP Publishing |
---|
These are possibly similar items as determined by title/reference text matching only.