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Raghavan, Seetha, Imbrie, Peter (2011) High-resolution stress mapping of polycrystalline alumina compression using synchrotron X-ray diffraction. Journal of Synchrotron Radiation, 18 (3). 497-505 doi:10.1107/s0909049511009071

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Reference TypeJournal (article/letter/editorial)
TitleHigh-resolution stress mapping of polycrystalline alumina compression using synchrotron X-ray diffraction
JournalJournal of Synchrotron Radiation
AuthorsRaghavan, SeethaAuthor
Imbrie, PeterAuthor
Year2011 (May 1)Volume18
Issue3
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0909049511009071Search in ResearchGate
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Mindat Ref. ID8486594Long-form Identifiermindat:1:5:8486594:2
GUID0
Full ReferenceRaghavan, Seetha, Imbrie, Peter (2011) High-resolution stress mapping of polycrystalline alumina compression using synchrotron X-ray diffraction. Journal of Synchrotron Radiation, 18 (3). 497-505 doi:10.1107/s0909049511009071
Plain TextRaghavan, Seetha, Imbrie, Peter (2011) High-resolution stress mapping of polycrystalline alumina compression using synchrotron X-ray diffraction. Journal of Synchrotron Radiation, 18 (3). 497-505 doi:10.1107/s0909049511009071
In(2011, May) Journal of Synchrotron Radiation Vol. 18 (3) International Union of Crystallography (IUCr)

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Tang, C. C., Bushnell-Wye, G., Cernik, R. J. (1998) New high- and low-temperature apparatus for synchrotron polycrystalline X-ray diffraction. Journal of Synchrotron Radiation, 5 (3). 929-931 doi:10.1107/s0909049597015513
Hart, M. (1975) Synchrotron radiation – its application to high-speed, high-resolution X-ray diffraction topography. Journal of Applied Crystallography, 8 (4) 436-444 doi:10.1107/s002188987501093x
Raghavan, Seetha, Imbrie, Peter K. (2009) Ex-SituStress Measurements in Polycrystalline Ceramics Using Photo-Stimulated Luminescence Spectroscopy and High-Energy X-Rays. Journal of the American Ceramic Society, 92 (7). 1567-1573 doi:10.1111/j.1551-2916.2009.03063.x
Sturhahn, W., Toellner, T. S. (2011) Feasibility of in-line instruments for high-resolution inelastic X-ray scattering. Journal of Synchrotron Radiation, 18 (2). 229-237 doi:10.1107/s0909049510053513
Said, Ayman H., Sinn, Harald, Divan, Ralu (2011) New developments in fabrication of high-energy-resolution analyzers for inelastic X-ray spectroscopy. Journal of Synchrotron Radiation, 18 (3). 492-496 doi:10.1107/s0909049511001828
Cornelius, T. W., Carbone, D., Jacques, V. L. R., Schülli, T. U., Metzger, T. H. (2011) Three-dimensional diffraction mapping by tuning the X-ray energy. Journal of Synchrotron Radiation, 18 (3). 413-417 doi:10.1107/s0909049511003190
Otto, J. W., Vassiliou, J. K., Frommeyer, G. (1997) Compression Behaviour of Elastically Anisotropic Polycrystals Using Energy-Dispersive X-ray Diffraction. Journal of Synchrotron Radiation, 4 (3). 155-162 doi:10.1107/s0909049597003294
Holmes, K. C., Rosenbaum, G. (1998) How X-ray Diffraction with Synchrotron Radiation Got Started. Journal of Synchrotron Radiation, 5 (3). 147-153 doi:10.1107/s0909049597018578
Huang, Xian-Rong (2011) An alternative scheme of angular-dispersion analyzers for high-resolution medium-energy inelastic X-ray scattering. Journal of Synchrotron Radiation, 18 (6). 899-906 doi:10.1107/s0909049511036703
Sakata, O., Tanaka, Y., Nikolaenko, A. M., Hashizume, H. (1998) Ultrahigh-Vacuum Facility for High-Resolution Grazing-Angle X-ray Diffraction at a Vertical Wiggler Source of Synchrotron Radiation. Journal of Synchrotron Radiation, 5 (4). 1222-1226 doi:10.1107/s0909049598000806
Korsunsky, Alexander M., Collins, Steve P., Owen, R. Alexander, Daymond, Mark R., Achtioui, Saïda, James, Karen E. (2002) Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS. Journal of Synchrotron Radiation, 9 (2). 77-81 doi:10.1107/s0909049502001905
 
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